Abstract: A volumetric stationary CT system has at least one stationary array of x-ray detectors extending proximate at least a portion of an imaging volume, at least one stationary x-ray source proximate the stationary array or arrays of x-ray detectors, and a collimator having a slit with a non-uniform opening width. The collimator is intermediate the stationary x-ray source and the stationary array of x-ray detectors. The result is a uniform flux normal to the detector array across the entire length thereof.

Abstract: An imaging inspection machine for inspecting objects located within articles, with the imaging inspection machine having an inspection location for articles having a quantity of objects located along a path of travel through an inspection location located within the imaging inspection machine. Imaging inspection devices are positioned on the frame and adapted for directing beams through articles as articles move through the inspection location within the imaging inspection machine. As a result of inspecting the articles, output signals are applied to a processing and analysis assembly which performs only simple table lookups into an appropriately formed table and one multiplication for each pixel to correct nonlinearities matched by a cubic polynomial.

Abstract: A method and device that provides independent temperature control of x-ray detector crystals, either singly or in small groups. In addition to a thermal control network for the crystals, electronic devices are associated with each detector crystal and are independently cooled using Peltier devices so that lifetime and reliability are maximized. In most operating environments the ambient temperature is less than the operating temperature of the detector crystals. In these situations, the heat removed from the electronics can be used to heat the detector crystals, resulting in efficient operation.

Abstract: An imaging inspection apparatus which utilizes a plurality of individual imaging inspection devices (e.g., X-ray Computer Tomography scanning devices) positioned on a frame for directing beams onto articles having objects therein to detect the objects based on established criteria. The apparatus utilizes a conveyor which is not physically coupled to the frame having the imaging inspection devices to pass the articles along a path of travel to an inspection location within the apparatus, whereupon the inspection devices direct beams onto the article and the beams are detected and output signals provided to a processing and analysis assembly which analyzes the signals and identifies certain objects which meet the criteria.

Abstract: An imaging inspection apparatus which utilizes a plurality of individual imaging inspection devices (e.g., X-ray Computer Tomography scanning devices) positioned on a frame for directing beams onto articles having objects therein to detect the objects based on established criteria. The apparatus utilizes a conveyor which is not physically coupled to the frame having the imaging inspection devices to pass the articles along a path of travel to an inspection location within the apparatus, whereupon the inspection devices direct beams onto the article and the beams are detected and output signals provided to a processing and analysis assembly which analyzes the signals and identifies certain objects which meet the criteria.