Abstract: A profiler arranged to be used on a host vehicle. The profiler is capable of (a) receiving data collected by the profiler while traveling over a surface and (b) generating a surface profile using the data collected with no minimum speed requirement. Since there is no minimum speed requirement, the profiler is capable of generating valid, repeatable and reliable road surface profiles in situations not previously possible, such as during a stop, during acceleration of the host vehicle, during deceleration of the host vehicle, or while the host vehicle is traveling at very low speeds below thresholds typically required for prior profilers.
Type:
Grant
Filed:
September 8, 2020
Date of Patent:
January 2, 2024
Assignee:
Surface Systems and Instruments, Inc.
Inventors:
Ethan M. Grother, Brent L. Bergman, Dennis P. Scott
Abstract: A profiling apparatus configured to generate a high-resolution surface topology map of a surface using surface profiling data combined with surveying data. The apparatus is configured to collect both a plurality of survey sample points and a plurality of profile sample points of the surface. The profile sample points are then correlated with the survey sample points in the Z direction. Once the correlation is performed, the correlated profile sample points are merged or “filled-in” between the survey sample points. The high-resolution surface topology map is generated from the merging of the survey and profile sample points. In various embodiments, the survey data may be generated using an inertial profiler, an inclinometer based walking device, or a rolling-reference type profile device.
Abstract: A method for generating a high-resolution surface topology map of a surface using surface profiling data combined with data collected from a surveying instrument. The system and method involve collecting a plurality of survey sample points and collecting a plurality of profile sample points of the surface. The profile sample points are then correlated with the survey sample points in the Z direction. Once the correlation is performed, the correlated profile sample points are merged or “filled-in” between the survey sample points. The high-resolution surface topology map is generated from the merging of the survey and profile sample points. In various embodiments, the survey data may be generated using an inertial profiler, an inclinometer based walking device, or a rolling-reference type profile device.