Abstract: The present invention relates to a characterization system (100) for characterizing an object (104) comprising a basic material and additional structural features. The system (100) comprises at least one irradiation source (102) for generating an irradiation beam for irradiating the object (104) to be characterized and at least one detector (106) for detecting said irradiation beam transmitted through the object (104). The system (100) furthermore comprises a control means (108) for obtaining at least two different basic datasets of the object (104) for different configurations of the irradiation beam, the object (104) and the detector (106). The latter may be obtained by shifting and/or rotating components and/or by selecting different components used for acquisition of the datasets.
Type:
Grant
Filed:
April 10, 2008
Date of Patent:
June 12, 2012
Assignee:
Sutor BVBA
Inventors:
Walter Schoenmaekers, Luc Van Hoorebeke, Bert Masschaele, Veerle Cnudde, Manuel Dierick, Jelle Vlassenbroek