Abstract: The invention relates to a method for optical inspection with a scanner which is arranged for detection and measurement of defects in or on a material which is inspected. The inspection takes place in successive sweeps essentially in the transverse direction of the material, with each respective sweep corresponding to a plurality of pixels in said scanner. The invention is characterized in that it comprises a rolling buffer storing at least one sweep which precedes another sweep in which at least one pixel indicates triggering corresponding to a detected defect in the material. The invention also relates to a device for such inspection. By means of the invention, an improved measurement accuracy is obtained when detecting defects using the measurement system described.

Abstract: The invention relates to an arrangement for sorting pellets (2), that includes a transportation device (3) for feeding the pellet (2), a first container (8) for faultless pellets (2a) fed over the end portion of the transportation device (3), a second container (13) for defective pellets (2b), a detector (9) for detecting defective pellets (2b) and a sorting device (11) for feeding any defective pellets (2b) detected to the second container (13). The invention is characterised in that the transportation device (3) is arranged with an angle of inclination (&agr;) relative to the horizontal plane which is selected within a predetermined interval corresponding to a predetermined, limited scattering of the trajectory of the faultless pellets (2a) fed over the end portion of the transportation device (3). The invention also relates to a method for such a sorting. Thanks to the invention, an improved sorting with an even and controlled flow of pellet and a high capacity is provided.

Abstract: A method and device for marking defects in or on a substantially planar strip (70, 170), preferably a strip of polymeric film. The defect is marked by means of firstly illuminating the width across the strip (70, 170) by means of a light source (90, 190) and detecting defects in or on the strip (70, 170) by means of a detector (10, 300). The strip (70, 170) is placed in a plane in connection with the light source (90, 190) and wherein the incident light is reproduced on the detector (10, 300). Thereafter, the defect is marked by means of a marker (200) which is placed in connection with the defect. The marker (200) is placed on a label (62, 162), which is attached onto the strip (70, 170).