Patents Assigned to Swedish LCD Center
  • Method of characterization of liquid crystal cell
    Patent number: 7277184
    Abstract: A method for simultaneous measuring a thickness of a liquid crystal layer and an average refractive index of the said liquid crystal in sealed liquid crystal cell is disclosed. The method is based on analysis of spectral positions of maxima and minima of interference oscillations, their magnitudes and their envelope in the spectrum of light mirrored by the liquid crystal cell at several different angles-of-incidence. The method is applicable to cells filled with different liquid crystals including cholesterics and smectics.
    Type: Grant
    Filed: May 19, 2003
    Date of Patent: October 2, 2007
    Assignees: Swedish LCD Center
    Inventors: Kent Skarp, Oleksandr Slobodyanyuk, Sergiy Valyukh
  • Method of characterization of liquid crystal cell
    Publication number: 20050219547
    Abstract: A method for simultaneous measuring a thickness of a liquid crystal layer and an average refractive index of the said liquid crystal in sealed liquid crystal cell is disclosed. The method is based on analysis of spectral positions of maxima and minima of interference oscillations, their magnitudes and their envelope in the spectrum of light mirrored by the liquid crystal cell at several different angles-of-incidence. The method is applicable to cells filled with different liquid crystals including cholesterics and smectics.
    Type: Application
    Filed: May 19, 2003
    Publication date: October 6, 2005
    Applicant: Swedish LCD Center
    Inventors: Kent Skarp, Oleksandr Slobodyanyuk, Sergiy Valyukh