Abstract: A contact assembly for use in testing electronic devices such as integrated circuits (IC's) and the like. The contact assembly has a test fixture having a test contactor, a corresponding carrier module aligned on a test tray for positioning the electronic devices to be tested in alignment with the test fixture, and a vertical drive for driving the carrier module to meet with the test contactor. The vertical drive is provided with an individual drive for giving an additional contact force to said carrier module and said test contactor. The vertical drive further includes a lead pusher for ensuring ideal contact pressure for the leads of the electric devices with the test contactor. The carrier module is provided with a plurality of slits for separating the leads of the electric devices and inviting the test contactor.

Abstract: A contact assembly for use in testing electric devices such as integrated circuits (IC's) and the like is comprised of a test socket and a corresponding carrier module for positioning the electric devices to be tested in alignment with the test socket. The carrier module is provided with a holding mechanism for retaining electronic devices to be tested in their proper position in the seat of the module, the holding mechanism being retractable so as to not interfere with the electrical contact between the socket and the electric device. In another aspect of the present invention, the contact assembly is provided with a slide positioning mechanism for slidably positioning the electronic device in its proper location on the seat of the carrier module.

Abstract: A separation and transfer apparatus for use in an electronic test system for testing electronic devices such as IC's, and the like. The apparatus has a housing for holding in a horizontal position, a magazine containing such electronic devices, an air blower for blowing compressed air at the electronic devices at an angle through a slit of the magazine so that the electronic devices are separated from one another and urged in a desired direction, a piston pin for insertion into a space developed between the last electronic device in the magazine and one end of the magazine, an advancing apparatus for changing the horizontal position of the air blower and the piston pin and for expelling the electronic devices from the magazine, and a controller for controlling the timing of the air blowing, the movement of the advancing apparatus, and the operation of the piston pin.

Abstract: A contact leaf bank for an electrical contactor preferably etched from a single uniform sheet of resiliently flexible, electrically conductive material comprises a ground sheet defining a plurality of uniformly-spaced, elongated, parallel slots in which are singularly disposed a plurality of resiliently flexible, elongated leaves each having and end portion adapted to be a contact finger, the tip of each contact finger preferably being rhodium-plated for hardness.

Abstract: A station for testing electrical devices under elevated and depressed temperature conditions, said devices being transported through and tested in the station while held in coordinated planar sets. The planarly arranged sets of devices are sequentially placed upon a platen movable along three mutually orthogonal axes. A test head has a plurality of electrical device contactors in planar arrangement corresponding to the arrangement of the devices sets. At least one axis along which the platen moves is orthogonal to a general plane of the contactors for establishing parallel contact between the devices and the contactors. During testing each of the leads of the devices resting upon the platen are electrically contacted by a contactor. The leads of the full set of electrical devices can be contacted simultaneously, or the leads can be contacted in subsets depending upon the capacity of the test head.

Abstract: A contact leaf bank for an electrical contactor preferably etched from a single uniform sheet of resiliently flexible, electrically conductive material comprises a ground sheet defining a plurality of uniformly-spaced, elongated, parallel slots in which are singularly disposed a plurality of resiliently flexible, elongated leaves each having and end portion adapted to be a contact finger, the tip of each contact finger preferably being rhodium-plated for hardness.

Abstract: An involuted track is defined by a spiralled wall normal to a planar surface. The planar surface is rotated coaxially with respect to the wall while the wall remains stationary with respect to the surface. Objects are loaded into the track through entrance, conducted along the track by means of the rotating planar surface, and leave the track via an exit. En route, the heat level of the objects are altered to bring them to a desired temperature by the time they reach the exit. The objects are preferably heated or cooled by a forced fluid of suitable temperature.

Abstract: A plurality of shuttle means receive untested devices from a feed track and position the devices in electrical contact with a contactor for testing. The shuttle means also discard tested devices via an exit track. Each shuttle means has a test track and a by-pass track. When all the shuttle means are in a load position, each track acts as a segment in a continuous track between the feed track and the exit track. When all the shuttle means are in a test position, each by-pass track acts as a segment in a continuous track between the feed track and the exit track. As long as each shuttle is either in its load position or test position, there is a continuous track between the feed track and the exit track, the segments of the track comprising either by-pass tracks, test tracks or any combination thereof. Defective devices can be pulled from test and discarded while others are undergoing testing.