Abstract: A portable intermittent fault detector includes an enclosure that carries electronics and a display. The electronics are selected, arranged, and connected in a manner that minimizes noise, including noise that could interfere with an ability of the portable intermittent fault detector to detect intermittent faults in complex electrical systems. The portable intermittent fault detector also includes a passive heat management system hat conveys heat away from the electronics. In addition, a test module assembly of the portable intermittent fault detector includes an inner assembly with test module boards that are rigidly secured to one another and an outer support that carries the inner assembly in a manner that absorbs impacts and other forces on the portable intermittent fault detector.

Abstract: Systems and methods according to one or more embodiments are provided for improved reliability and efficiency of high side power stage output drivers used in switching amplifiers. In one example, a system includes a power device structure comprising an nwell structure formed within a semiconductor p substrate and a pwell structure formed within the nwell structure. The system further includes one or more NMOS electronic power devices formed on the pwell structure and a pwell guardring formed on the pwell structure configured to surround the one or more NMOS electronic power devices. The system further includes an nwell guardring formed on the nwell structure configured to surround the pwell structure and a p+ guardring formed on the nwell structure configured to surround the nwell guardring.

Abstract: Embodiments are directed to identifying intermittent faults in a unit under test (UUT), and to mapping interconnections between connection points in a UUT. In one scenario, a testing apparatus includes an interface for electrically attaching the UUT to a testing module and an input circuit for supplying an individual stimulus signal to each unpowered connection point in the UUT. The testing apparatus also includes an active intermittence detecting circuit electronically connected to each connecting point in the UUT. A stimulus signal is applied simultaneously to each connecting line, so that an intermittent fault on any line will generate a trigger on those connection lines that have an intermittent fault. The testing apparatus also includes a logic circuit that determines when a trigger has been generated on the UUT, determines the connection point of the trigger, assigns a timestamp to the intermittent fault, and generates reporting data for the intermittent fault.

Abstract: An apparatus for testing connections in a system has a plurality of inputs each adapted to couple to a test point in the system under test and a switching module. The switching module includes a first output selectively coupled to receive a first group of one or more of the inputs and a set of outputs corresponding in number to the plurality of inputs, each being selectively coupled to receive a corresponding one of the plurality of inputs. The apparatus may also include a meter coupled to the first switching module output and an array of nodes coupled to the set of switching module outputs, where each node couples a signal to a row sense line and a column sense line.

Abstract: An apparatus for testing connections in a system has a plurality of inputs each adapted to couple to a test point in the system under test and a switching module. The switching module includes a first output selectively coupled to receive a first group of one or more of the inputs and a set of outputs corresponding in number to the plurality of inputs, each being selectively coupled to receive a corresponding one of the plurality of inputs. The apparatus may also include a meter coupled to the first switching module output and an array of nodes coupled to the set of switching module outputs, where each node couples a signal to a row sense line and a column sense line.

Abstract: A non-invasive method of treating, controlling or preventing medical, psychiatric or neurological disorders is provided using transcutaneous electrical stimulation. A plurality of stimulation frequency parameters are used ranging from a relatively high frequency, for example about 40,000 Hertz, to a relatively low frequency, for example about 250 Hertz. The entirety of frequency parameters may be administered at each of a plurality of stimulation intensity levels. In particular, stimulating may begin at a first highest frequency parameter and a first lowest intensity parameter with the stimulation frequency parameter incrementally decreasing to the lowest frequency parameter. Then the frequency parameter is returned to the highest frequency parameter, and the intensity parameter increased to a next higher intensity parameter, and again stimulating through the plurality of frequency parameters from the highest frequency to the lowest frequency.

Abstract: A non-invasive method of treating, controlling or preventing medical, psychiatric or neurological disorders is provided using transcutaneous electrical stimulation. A plurality of stimulation frequency parameters are used ranging from a relatively high frequency, for example about 40,000 Hertz, to a relatively low frequency, for example about 250 Hertz. The entirety of frequency parameters may be administered at each of a plurality of stimulation intensity levels. In particular, stimulating may begin at a first highest frequency parameter and a first lowest intensity parameter with the stimulation frequency parameter incrementally decreasing to the lowest frequency parameter. Then the frequency parameter is returned to the highest frequency parameter, and the intensity parameter increased to a next higher intensity parameter, and again stimulating through the plurality of frequency parameters from the highest frequency to the lowest frequency.

Abstract: Provided herein is a non-invasive method of treating, controlling or preventing medical, psychiatric or neurological disorders, using transcutaneous electrical stimulation. The method employs a plurality of stimulation frequency parameters, ranging from a relatively high frequency, for example about 40,000 Hertz, to a relatively low frequency, for example about 250 Hertz, the entire plurality of frequency parameters being administered at each of a plurality of stimulation intensity levels. In particular, the method involves stimulating at a first highest frequency parameter and a first lowest intensity parameter, incrementally decreasing the stimulation frequency parameter a lowest frequency parameter, increasing the frequency parameter to the highest frequency parameter and increasing the intensity parameter to a next highest intensity parameter, and again stimulating through the plurality of frequency parameters from the highest frequency to the lowest frequency.

Abstract: An MOS current mirror includes a floating node onto which and from which electrons may be transported by control signals and electrical semiconductor structures in order to adapt the current mirror to supply a desired output current when a particular input calibration current is present.

Abstract: An integrating photosensor includes an NPN phototransistor having its collector connected to a source of positive voltage, a P-channel MOS transistor having its gate connected to row-select line, its source connected to the emitter of the phototransistor, and its drain connected to a column sense line. The NPN phototransistor has an intrinsic base-collector capacitance. An integrating sense amplifier according to the present invention includes an amplifying element having an inverting input and a non-inverting input. The non-inverting input is connected to a source of reference voltage the inverting input is connected to a sense line. A P-channel balance transistor is connected between the inverting input and the output of the amplifying element and a capacitor is also connected between the inverting input and output of the amplifying element. An exponential feedback element is connected between the output and the inverting input of the amplifying element.