Abstract: A magnet structure including sets of permanent magnets installed periodically in a direction S with a spatial period ?u, each set including a magnet of each of a first beam, a second beam, a third beam, and a fourth beam, the magnets of each beam being arranged in succession in the direction S, the first beam and the second beam being arranged in succession in a direction Z, the fourth beam and the third beam being arranged in succession in the direction Z, the third beam and the second beam being arranged in succession in a direction X, and the fourth beam and the first beam being arranged in succession in the direction X, wherein, for at least four successive sets of magnets with a spatial period ?u, the magnetization vector of each magnet of each beam has a non-zero component in each of the directions X, S and Z.

Abstract: A two-period inverter, including a series of permanent magnets with a spatial periodicity of ?0 or (2n+1)?0 or 2n?0 along a longitudinal axis Y and first moving apparatus arranged to modify along the axis Y, with respect to a reference position along the axis Y, the relative position of the first and second series, which move as one, with respect to the position of the third and fourth series, which move as one, by a distance (2n+1)?0/2 or (2n?1)?0/2, so that the inverter is placed in an offset position along the axis Y is discussed.

Abstract: A multipole electromagnet for injecting particles, including a hollow duct extending along a longitudinal axis, and a plurality of wire conductors that are placed parallel or substantially parallel to the longitudinal axis along the duct, electrically connected in series and arranged to conduct electric current. The directions of the electric current flowing through the wire conductors are symmetric about a first plane of symmetry. The wire conductors are distributed in multiple carrier planes that are parallel or substantially parallel to the first plane of symmetry, including two main carrier planes that are symmetric about the first plane of symmetry and located outside the hollow, each main carrier plane carrying wire conductors that conduct the electric current in the first direction and wire conductors that conduct the electric current in the second direction opposite the first direction.

Abstract: The invention relates to a tandem mass spectrometer comprising an ionization source that can produce ions; a mass analyzer comprising an ion trap arranged in such a way as to receive ions from the ion source and a detector that can detect ions leaving the ion trap according to the mass to charge (m/z) ratio thereof; ion activation means for activating ions that can fragment at least some of the ions trapped in the ion trap; and coupling means arranged between the ion trap and said ion activation means. According to the invention, the ion activation means consists of a glow discharge lamp that can generate a light beam oriented towards the ion trap, said light beam being electromagnetic radiation in the vacuum ultraviolet wavelength range with photon energies of between 8 eV and 41 eV in such a way as to fragment at least some of the ions trapped in the ion trap.

Abstract: A radioluminescent compound for radiotherapy and deep photodynamic therapy (Deep PDT), the radioluminescent compound including a molecular conjugate made up of a radioluminescent molecule and one photosensitizer, the radioluminescent molecule being suitable for absorbing an X-ray with energy higher than an absorption threshold and for emitting luminescent radiation in the visible domain, and the photosensitizer being suitable for absorbing the luminescent radiation and producing singlet oxygen.

Abstract: The invention relates to a device for an atomic force microscope (AFM) for the study and/or modification of surface properties. The device comprises a cantilever (flexible bar) having an integrated, piezoresistive sensor, an integrated bimorphic actuator, and a measuring tip. The measuring tip carries at least two metal electrodes, which can be activated via electrical terminals. The measuring tip and/or the cantilever have at least one nanoscopic hole through which synchrotron radiation or laser light is directed onto the material surface to be studied. Furthermore, the invention relates to a method for the study and modification of surface properties and surface-proximal properties, which can be executed using such a device. To this end, atomic force microscopy (AFM), surface enhanced Raman scattering (SERS), photo emission spectroscopy (XPS, XAS), and material modification by local exposure are executed in sequence or simultaneously using the same device.

Abstract: The invention relates to a device for an atomic force microscope (AFM) for the study and/or modification of surface properties. The device comprises a cantilever (flexible bar) having an integrated, piezoresistive sensor, an integrated bimorphic actuator, and a measuring tip. The measuring tip carries at least two metal electrodes, which can be activated via electrical terminals. The measuring tip and/or the cantilever have at least one nanoscopic hole through which synchrotron radiation or laser light is directed onto the material surface to be studied. Furthermore, the invention relates to a method for the study and modification of surface properties and surface-proximal properties, which can be executed using such a device. To this end, atomic force microscopy (AFM), surface enhanced Raman scattering (SERS), photo emission spectroscopy (XPS, XAS), and material modification by local exposure are executed in sequence or simultaneously using the same device.