Abstract: A method for reuse of extracted layout-dependent effects for circuit design using circuit stencils includes receiving a schematic of an integrated circuit including a circuit segment. A circuit stencil corresponding to the circuit segment is instantiated in a schematic of a second integrated circuit. The circuit stencil includes layout-dependent effects information for the circuit segment extracted from a layout of the first integrated circuit. Simulation is performed on the schematic of the second integrated circuit using the layout-dependent effects information for the circuit segment. A layout of at least a portion of the second integrated circuit corresponding to the circuit segment is generated responsive to performing the simulation.

Abstract: A reliability aware negative bit-line write assist (RA-NBL) circuit comprises a coupling capacitor to provide a negative bump for write assist, and a control input generator control charging of the coupling capacitor, such that the negative bump is high at a low voltage, and the negative bump is low at a high voltage.

Abstract: A method for reconstructing at least one output signal associated to a sequential logic circuitry block of a circuit is disclosed. At least one input signal is associated to the sequential logic circuitry block. The method comprises determining a value of the at least one output signal depending on the at least one input signal and determining a transfer function for computing the value of the output signal directly after a timestamp depending on the input signal and/or on the value of the output signal directly before the timestamp. The method further comprises computing the value of the at least one output signal directly after the timestamp as a function value of the transfer function, if a reconstruction condition is fulfilled.

Abstract: A computer-implemented method for characterizing a circuit is presented. The method includes receiving, by the computer, data representative of the circuit and at least one defect of the circuit. The method further includes simulating, using the computer, the circuit to obtain a first timing characteristic, and simulating, using the computer, the circuit with the at least one defect to obtain a second timing characteristic. The method further includes identifying, using the computer, an association between at least one test vector and the at least one defect in accordance with the first timing characteristic, the second timing characteristic, and a multitude of strobes applied during a first time interval associated with the at least one test vector, when the computer is invoked to characterize the circuit.

Abstract: A system for serializing input data signals and generating an output data signal includes a FIFO memory that launches the input data signals at different phases of a clock signal. The system further includes multiple stages of a serializer circuit, and each stage of the serializer circuit receives a clock signal. Each successive stage includes half the number of serializer circuits that are included in the previous stage, and each successive stage is clocked by a clock signal that transitions at twice the frequency of the previous stage clock signal. The serializer circuits that belong to a single stage receive the clock signal with different phase. The phase and frequency of clock signals of serializer stages are adjusted such that a launched input data signal is outputted as the output data signal. Further, a critical path for each serializer circuit is equal to full clock cycle of the clock signal.

Abstract: Disclosed is a technology for parallelized design verification of two circuit designs at a register transfer level. A plurality of potential equivalent sub-circuit pairs is identified from the circuit designs to create a proof-tree structure. The proof-tree structure includes a root-proof, a plurality of parent-proofs downchain of said root-proof and a plurality of child-proofs downchain of at least one of the parent-proofs. Each one of the child-proofs is associated with a first equivalency status of one of the potential equivalent sub-circuit pairs. The parent-proofs are associated with second equivalency statuses dependent upon the first equivalency statuses of downchain child-proofs. The root-proof is associated with a third functional equivalency status of the two circuit designs dependent upon the second equivalency statuses of downchain parent-proofs. This Abstract is not intended to limit the scope of the claims.

Abstract: Roughly described, a technique for approximating a target property of a target material is provided. For each material in a plurality of anchor materials, a correspondence is provided between the value for a predetermined index property of the material and a value for the target property of the material, the values of all the index properties being different. A predictor function is identified in dependence upon the correspondence. A computer system determines a value for the target property for the target material in dependence upon the predictor function and a value for the index property for the target material. The determined value for the target property for the target material is reported to a user. The correspondence can be provided in a database on a non-transitory computer readable medium. The correspondence can be determined experimentally or analytically for each material in a plurality of anchor materials.

Abstract: The independent claims of this patent signify a concise description of embodiments. Disclosed is technology for reducing write disturbance while writing data into a first SRAM cell and accessing a second SRAM cell in a row of SRAM cells. This Abstract is not intended to limit the scope of the claims.

Abstract: A method for generating FPGA-based prototype systems capable of implementing UFS HS-G4 communication protocols using inexpensive/slow FPGAs. ASIC/SoC-targeted circuit designs are modified to include a speed converter that causes a UFS controller to generate transmitted data streams at one-half operating speed (e.g., 146 MHz) during HS-G4 operations, modifies the transmitted data streams to intersperse filler data values between transmitted data values, and transmits the modified data streams to M-PHY physical interconnect devices (PIDs) at full speed (e.g., 292 MHz). The speed converter also receives full-speed HS-G4 data streams that include both data and filler values and causes the UFS controller to operate at one-half operating speed (e.g., 146 MHz) such that only data values are read. PLD-based prototype systems that include separate M-PHY PIDs mounted on PCBs are efficiently configured to implement the modified circuit design.

Abstract: Devices and methods are described relating to capacitor energy storage devices that are small in size and have a high energy stored to volume ratio. The capacitor devices include 2D material electrodes. The capacitor devices offer very fine granularity with high stacking possibilities which may be used in super capacitors and capacitor arrays. The devices include interleaved laminations 2D material electrode layers, for example graphene, and dielectric layers, for example Hafnium Oxide. In an embodiment a capacitor device includes 10,000 layers of interleaved graphene separated by 9,999 layers of HfO. Odd layers of the graphene are electrically connected to a first terminal and even layers of graphene are electrically connected to a second terminal of the capacitor device.

Abstract: A formal verification tool that verifies multiple sequentially-generated versions of a core circuit design by obtaining search path information from the formal verification solver for each property that is proven or disproven during a first formal verification session involving an earlier-generated circuit design version, and utilizing the search path information to perform search-path verification processes during a subsequent formal verification session to quickly verify the proven/disproven properties in a later-generated circuit design version. Each property's search path information includes counterexample traces or proof artifacts identifying the search operations utilized to achieve a corresponding counterexample or proof object that proves/disproves the property. Search-path verification involves applying the stored search path information to the later-generated circuit design version, and determining if the same counterexample or proof object is achieved.

Abstract: A Remote Test Separation (RTS) system comprising an original software product instrumented for testing and a shared memory accessible to the original software product, the shared memory including a plurality of coverage counters. The RTS system further comprising an agent, capable of accessing the shared memory, the agent to read the plurality of coverage counters, the agent to read the plurality of coverage counters at an end of a test, and write coverage data to another memory. The RTS system runs a plurality of tests without interruption, and generates coverage data associated with a plurality of sequential tests and records the associations between lines of code and an associated test.

Abstract: An electronic design automation tool includes an application program interface API which includes a set of parameters and procedures supporting atomistic scale modeling of electronic materials. The procedures include a procedure to execute first principles calculations, a procedure to process results from the first principles calculations to extract device scale parameters from the results, a procedure to determine whether the extracted device scale parameters lie within a specified range. The procedures also include a procedure to parameterize an input parameter of a first principles procedure, including a procedure to execute a set of DFT computations across an input parameter space to characterize sensitivity of one of the intermediate parameter and the output parameter. Also included is a procedure to execute a second set of DFT computations across a refined input parameter space. The procedures include a procedure that utilizes DFT computations to parameterize the force field computations.

Abstract: A clock and data recovery (CDR) circuit receives a data signal and generates a clock signal and a recovered data signal. The CDR circuit includes a clock-recovery circuit (CRC), a sampling phase-recovery circuit (PRC), an analog-to-digital converter (ADC), and a data-recovery circuit (DRC). The CRC receives the data signal and generates an intermediate clock signal. The PRC receives the intermediate clock signal, a sampled data signal and the recovered data signal, and generates the clock signal. The ADC receives the data signal and generates the sampled data signal. The DRC receives the sampled data signal and generates the recovered data signal. The clock signal is phase and frequency synchronized with the data signal.

Abstract: An application deployment system provides one or pages of an application to a client device. The pages may specify application code for performing functions and presenting content of the application by the client device as well as a reference to third-party code. As users interact with the page on the client device, the user may interact with the page to add sensitive data for transmission to the application deployment system or receive sensitive data from the application deployment system. To detect and prevent inappropriate use by the third party code, messages relating to the third-party code is monitored for requests to send messages that contain information matching the user information. When there is a match, the message may be prevented from transmission or the application developer notified about the sensitive data request.

Abstract: Roughly described, a task control system for managing multi-scale simulations receives a case/task list which identifies cases to be evaluated, at least one task for each of the cases, and dependencies among the tasks. A module allocates available processor cores to at least some of the tasks, constrained by the dependencies, and initiates execution of the tasks on allocated cores. A module, in response to completion of a particular one of the tasks, determines whether or not the result of the task warrants stopping or pruning tasks, and if so, then terminates or prunes one or more of the uncompleted tasks in the case/task list. A module also re-allocates available processor cores to pending not-yet-executing tasks in accordance with time required to complete the tasks and constrained by the dependencies, and initiates execution of the tasks on allocated cores.

Abstract: A method to evaluate a resistor structure is described. In one embodiment, the method includes receiving an input file specifying a resistor structure, modifying at least one aspect of the resistor structure, and polishing data representing the modified resistor structure. The method further comprises, in one embodiment, initializing at least one walk, and performing the walk, and providing an output about the resistor structure based on the performed at least one walk.

Abstract: A hardware verification system according to one embodiment includes, in part, a plurality of programmable devices. The plurality of programmable devices include a master scheduler, a plurality of schedulers and a plurality of programmable delay elements. A first one of the plurality of schedulers is configured to receive one or more delay values associated with one or more of the plurality of delay elements. Each of the plurality of programmable delay elements corresponds to a delay. The first scheduler is further configured to send a parameter corresponding to the one or more delay values to the master scheduler, and generate one or more signals corresponding to the one or more delay elements in response to a control signal the first scheduler receives from the master scheduler.

Abstract: A method for improving an integrated circuit design which has transistors with nanowire channels comprises identifying a particular device having a particular transistor with a nanowire channel; and adding to the integrated circuit design circuitry which, when activated, repairs the particular transistor by self-heating. The method can comprise determining a memory cell that has a read current below a passing criteria, the memory cell having a transistor with a nanowire channel on a current path through which the read current flows; and applying a stress on the memory cell to repair the nanowire channel of the transistor in the memory cell on the current path. The determining step can include sensing read currents of memory cells in an array of memory cells; and determining one or more memory cells in the array of memory cells having read currents below the passing criteria, using the read currents sensed.

Abstract: Methods and apparatuses relate to implanting a surface of a semiconductor substrate with dopants, making undoped semiconductor material directly on the surface implanted with the dopants, and making a transistor with a transistor channel in the undoped semiconductor material, such that the transistor channel of the transistor remains undoped throughout manufacture of the integrated circuit.