Patents Assigned to SYSTEM SQUARE INC.
  • Patent number: 10859516
    Abstract: An X-ray inspection apparatus includes: an X-ray emission unit for emitting an X-ray to an object; an X-ray detection unit for detecting each X-ray photon transmitted through the object by discriminating energy possessed by the photon into one or more energy region(s) in accordance with a predetermined threshold level; a storage unit for storing the object and the associated threshold level; a threshold level setting unit for referring to the storage unit to keep a threshold level for the object specified by inputted information so that the X-ray detection unit can refer to the threshold level as the predetermined threshold level; and an inspection unit for inspecting the object based on a number of photons or an amount corresponding to the number of the photons detected by the X-ray detection unit for each of the one or more energy region(s).
    Type: Grant
    Filed: September 20, 2017
    Date of Patent: December 8, 2020
    Assignee: SYSTEM SQUARE INC.
    Inventors: Noriaki Ikeda, Sachihiro Nakagawa
  • Patent number: 9865424
    Abstract: An X-ray inspection system of the present application is capable of blocking the effect of heat from an X-ray source, thereby making it possible to place a heat-sensitive circuit component in the same housing space as the X-ray source. The X-ray inspection system includes a housing 10 provided with an upper housing space 11, in which an X-ray source 32 housed in a cooling container 30 is placed. Due to pressure of a pump 36, a cooling medium circulates between the cooling container 30 and a heat radiating device 33, thereby suppressing the temperature rise of the cooling container 30. Since the cooling container 30 is placed in the upper housing space 11, the upper housing space 11 serves as a cooling space, suppressing the temperature rise. Therefore, heat-sensitive or heat-producing circuit components can be placed in the upper housing space 11.
    Type: Grant
    Filed: March 9, 2015
    Date of Patent: January 9, 2018
    Assignee: SYSTEM SQUARE INC.
    Inventors: Noriaki Ikeda, Kazunori Yamada
  • Patent number: 9733384
    Abstract: A package inspection system is provided, where an electromagnetic-wave detection part is hardly affected by illumination light for optical detection. Below a gap 6c of a conveyor mechanism 6 for conveying a package, provided are an X-ray sensor 13 for detecting X rays transmitted through the package and an illumination part 16 for applying illumination light to the gap 6c. The X-ray sensor 13 and the illumination part 16 are separated from each other by a partition 42. A light-shielding member 43 is placed in the path of X-ray incidence to the X-ray sensor 13. The light-shielding member 43 is formed of a material that allows passage of the X rays but does not allow passage of the illumination light and is hardly deteriorated by irradiation of the X rays, e.g., a carbon sheet.
    Type: Grant
    Filed: October 3, 2013
    Date of Patent: August 15, 2017
    Assignee: System Square Inc.
    Inventors: Atsushi Suzuki, Noriaki Ikeda
  • Patent number: 9541499
    Abstract: A package inspection system includes a conveyor mechanism 6, an X-ray generator 10 applying X rays to a package W1 conveyed by the conveyor mechanism 6, an X-ray sensor 13, and an optical sensor 15. First image data showing the outline of the content of the package W1 are generated based on detection output from the X-ray sensor 13. Second image data showing the outline of the wrapping of the package W1 are generated based on detection output from an optical sensor 15. The relative position of the wrapping and the content is determined based on the first and second image data, so that failures, e.g., the content caught in a seal of the wrapping can be detected accurately. The package inspection system can accurately determine a position of a wrapping and the content of a package even if a package has a light non-transmissive wrapping.
    Type: Grant
    Filed: April 7, 2015
    Date of Patent: January 10, 2017
    Assignee: SYSTEM SQUARE INC.
    Inventor: Noriaki Ikeda