Patents Assigned to TA Instruments
  • Patent number: 5439291
    Abstract: The present invention is a modulated differential thermal analysis technique for determining the composition, phase, structure, identification, or other properties of a material that undergoes a transition as function of temperature or other driving variable. As applied to differential scanning calorimetric analysis (DSC), the preferred embodiment comprises (1) heating a sample of the material with a linear temperature ramp that is modulated with a sinusoidal heating rate oscillation; (2) simultaneously heating a reference at the same linear temperature ramp; (3) measuring the differential temperature of the sample and reference; and (4) deconvoluting the resultant heat flow signal into rapidly and non-rapidly reversible components.
    Type: Grant
    Filed: December 22, 1993
    Date of Patent: August 8, 1995
    Assignee: TA Instruments, Inc.
    Inventor: Michael Reading
  • Patent number: 5368391
    Abstract: The present invention relates to analytical methods for determining the composition of a material that undergoes a transition as a function of a driving variable. As applied to thermogravimetric analysis (TGA), a first preferred embodiment comprises (1) decreasing the heating rate when deviations from a baseline signal are detected; (2) establishing a minimum heating rate; (3) forcing the heating rate to a predetermined maximum whenever the rate of change of the weight change with respect to the temperature falls below a predetermined value; and (4) adjusting the heating rate according to the rate of change of the weight of the sample to track a predetermined rate of change of the weight of the sample.
    Type: Grant
    Filed: November 18, 1992
    Date of Patent: November 29, 1994
    Assignee: TA Instruments, Inc.
    Inventors: Benjamin S. Crowe, Steven R. Sauerbrunn
  • Patent number: 5346306
    Abstract: The present invention relates to differential analytical techniques for determining the composition, phase, structure, identification or other properties of a material that undergoes a transition as function of a driving variable. As applied to differential scanning calorimetric analysis (DSC), the preferred embodiment comprises: (1) heating a sample of the material with a linear temperature ramp that is modulated with a sinusoidal heating rate oscillation; and (2) deconvoluting the resultant heat flow signal into rapidly reversible and non-rapidly reversible components.
    Type: Grant
    Filed: May 7, 1993
    Date of Patent: September 13, 1994
    Assignee: TA Instruments, Inc.
    Inventors: Michael Reading, Brian K. Hahn, Benjamin S. Crowe
  • Patent number: 5335993
    Abstract: A method and apparatus for measuring the thermal conductivity of materials using modulated differential scanning calorimetry (MDSC). Two MDSC heat capacity measurements are made consecutively. One measurement is made under conditions which ensure obtaining a fairly accurate value for the heat capacity of the material ("quasi-ideal conditions"). Another measurement is made under conditions such that the measured effective heat capacity differs from the accurate value of the heat capacity due to thermal conductivity effects. Generally, the non-ideal conditions differ from the ideal conditions by one parameter, such as the size of the sample, the modulation frequency used to measure the heat capacity, or, for thin films, the presence or absence of a specimen on the thin film. The thermal conductivity of the material is then calculated from the difference between the heat capacity measured under quasi-ideal conditions and the effective heat capacity measured under non-ideal conditions.
    Type: Grant
    Filed: June 30, 1993
    Date of Patent: August 9, 1994
    Assignee: TA Instruments, Inc.
    Inventors: Sanford M. Marcus, Michael Reading
  • Patent number: 5321719
    Abstract: The present invention is a thermogravimetric instrument having a ceramic sample support and a ceramic balance beam. The ceramic platform is rigidly attached to the hot end of the ceramic balance beam. An inert metal liner is press fitted into the ceramic sample platform. In a preferred embodiment, a thermocouple is directly attached to the inert metal liner. The thermocouple wires are routed through the length of the ceramic balance beam and are attached to the cold end of the ceramic balance beam with adhesive. The inert metal liner could be fabricated from platinum or from platinum alloys.
    Type: Grant
    Filed: May 26, 1993
    Date of Patent: June 14, 1994
    Assignee: TA Instruments, Inc.
    Inventors: Kevin J. Reed, Michael J. Levchak, John W. Schaefer
  • Patent number: 5288147
    Abstract: A differential thermal analysis sensor consisting of two low-impedance differential thermopiles. Each thermopile consists of a series of thermocouples joined in series, with the measuring junctions of the thermocouples arranged around a uniform temperature measuring region, and the thermoelectric reference junctions of the thermocouples arranged around a uniform temperature thermoelectric reference region. The differential thermal analysis sensor can be used for single-sample heat flux differential thermal analysis measurements, dual-sample heat flux differential thermal analysis measurements, or power compensation differential thermal analysis measurements.
    Type: Grant
    Filed: November 9, 1992
    Date of Patent: February 22, 1994
    Assignee: TA Instruments, Inc.
    Inventors: John W. Schaefer, Robert L. Danley
  • Patent number: 5248199
    Abstract: The present invention is a spatially-resolved differential analysis technique. A modulated differential analysis technique is applied using a proximal probe to obtain a spatially resolved characterization of a heterogeneous sample comprising at least two phases. As applied to spatially-resolved modulated differential scanning calorimetry, the present invention comprises a thermocouple probe that is scanned over the sample surface. The differential temperature of the area of the sample just beneath the thermocouple probe is obtained with respect to the temperature of a reference. The temperature of the sample and the reference is modulated above and below a transition temperature for one phase of the sample. The signal from the thermocouple probe is deconvoluted to obtain an image of the sample delineating the regions of the sample having that phase.
    Type: Grant
    Filed: May 26, 1992
    Date of Patent: September 28, 1993
    Assignee: TA Instruments, Inc.
    Inventor: Michael Reading
  • Patent number: 5224775
    Abstract: The present invention relates to differential analytical techniques for determining the composition, phase, structure, identification or other properties of a material that undergoes a transition as function of a driving variable. As applied to differential scanning calorimetric analysis (DSC), the preferred embodiment comprises: (1) heating a sample of the material with a linear temperature ramp that is modulated with a sinusoidal heating rate oscillation; and (2) deconvoluting the resultant heat flow signal into rapidly reversible and non-rapidly reversible components.
    Type: Grant
    Filed: March 2, 1992
    Date of Patent: July 6, 1993
    Assignee: TA Instruments, Inc.
    Inventors: Michael Reading, Brian K. Hahn, Benjamin S. Crowe
  • Patent number: 5165792
    Abstract: The present invention relates to analytical methods for determining the composition of a material that undergoes a transition as a function of a driving variable. As applied to thermogravimetric analysis (TGA), a first preferred embodiment comprises (1) decreasing the heating rate when deviations from a baseline signal are detected; (2) establishing a minimum heating rate; (3) forcing the heating rate to a predetermined maximum whenever the rate of change of the weight change with respect to the temperature falls below a predetermined value; and (4) adjusting the heating rate according to the rate of change of the weight of the sample to track a predetermined rate of change of the weight of the sample.
    Type: Grant
    Filed: March 1, 1991
    Date of Patent: November 24, 1992
    Assignee: TA Instruments, Inc.
    Inventors: Benjamin S. Crowe, Steven R. Sauerbrunn
  • Patent number: 5095278
    Abstract: A planar interdigitated dielectric sensor useful for measuring the surface properties of a material is disclosed. The sensor is formed on an insulating substrate. Attached to the surface of the substrate is an excitation electrode and a response electrode disposed in an interdigitated pectinate configuration and a resistance temperature device a (metallic strip). Filling the space between the electrodes and the metallic strip is an insulating material of known dielectric properties. The upper surface of the electrodes and the metallic strip are generally coplanar with respect to the insulating material between the electrodes thus forming a flat upper surface on the sensor. This flat upper surface serves to eliminate air gaps between the sensor surface and sample when analyzing relatively viscous materials.
    Type: Grant
    Filed: June 29, 1989
    Date of Patent: March 10, 1992
    Assignee: TA Instruments, Inc.
    Inventor: Kendall B. Hendrick
  • Patent number: 5065106
    Abstract: A parallel plate or single surface dielectric analyzer is disclosed including: a distance sensor for accurately measuring the varying distance between the electrodes, such as a linear voltage differential transformer (LVDT), and apparatus responsive to the distance sensor for positioning the electrodes; a force transducer for measuring the applied force on the sample and apparatus responsive to the force transducer to give a desired force by varying the electrode spacing; disposable electrodes made using thick film technology composed of a ceramic substrate with a conductor adhered to its surface; and a temperature sensor built into one of the electrodes such as a platinum ring adhered to the surface of one of the electrodes and apparatus to measure the resistance across the platinum ring.
    Type: Grant
    Filed: February 25, 1991
    Date of Patent: November 12, 1991
    Assignee: TA Instruments, Inc.
    Inventors: Kendall Hendrick, John R. Reader, Jr.
  • Patent number: 5045798
    Abstract: A planar interdigitated dielectric sensor useful for measuring the surface properties of a material is disclosed. The sensor is formed on an insulating substrate. Attached to the surface of the substrate is an excitation and response electrode disposed in an interdigitated pectinate configuration. Filling the space between the electrodes is an insulating material of known dielectric properties. The upper surface of the electrodes are generally coplanar with respect to the insulating material between the electrodes thus forming a flat upper surface on the sensor. This flat upper surface serves to eliminate air gaps between the sensor surface and sample when analyzing relatively viscous materials.
    Type: Grant
    Filed: January 24, 1990
    Date of Patent: September 3, 1991
    Assignee: TA Instruments, Inc.
    Inventor: Kendall B. Hendrick