Abstract: A method and system is presented for measuring a data access time of an embedded macro module in an integrated circuit. A single external test signal is inputted into the embedded macro module for enabling a data input therein and extracting a data output therefrom. A pulse width of the single external test signal is incrementally increased until a latch of the data output is observed. Then, the data access time is obtained, as its substantially equals a time interval of the increased pulse width.