Patents Assigned to Tanaka Systems Incorporated
  • Detecting fatigue from magnetic characteristics
    Patent number: 6305229
    Abstract: Fatigue in a magnetically sensitive detector element (20, 172) can be evaluated using the expression H∞ log(N). Employing this method, measuring changes in magnetization of the detector element (20, 172) permit predicting fatigue with many practical applications.
    Type: Grant
    Filed: May 18, 1999
    Date of Patent: October 23, 2001
    Assignee: Tanaka Systems Incorporated
    Inventor: Kiyoshi Inoue