Patents Assigned to Target Microwave
  • Apparatus and method for detection and thickness measurement of coatings over a surface
    Patent number: 5781115
    Abstract: The invention is to a system and method for detecting materials on a conductive surface and measuring the thickness and permittvity of the material. A polarized Radio Frequency signal is reflected from a conduction surface having a material thereon. The reflected de-polarized signal is then processed to determine the thickness and permittivity of the material on the conductive surface.
    Type: Grant
    Filed: April 3, 1995
    Date of Patent: July 14, 1998
    Assignee: Target Microwave
    Inventor: Donald F. Shea