Patents Assigned to Tauton Technologies, Inc.
  • Beam intensity profilometer
    Patent number: 4916319
    Abstract: A beam intensity profilometer produces a fluorescent emission distribution having a spatial distribution linearly proportional to the local intensity of an incident UV beam shined into the profilometer. The spatial distribution of the UV beam is analyzed and displayed as a function of the fluorescent emission.
    Type: Grant
    Filed: April 22, 1988
    Date of Patent: April 10, 1990
    Assignee: Tauton Technologies, Inc.
    Inventors: William B. Telfair, Clifford A. Martin, Paul R. Yoder, Eugene I. Gordon