Patents Assigned to Tava Corporation
  • Method for measuring coating thickness
    Patent number: 5029337
    Abstract: A method of measuring a coating thickness applied on a target of constant base material, such coating containing a non-radioactive labelling material having an atomic number higher than 20.
    Type: Grant
    Filed: December 20, 1989
    Date of Patent: July 2, 1991
    Assignee: Tava Corporation
    Inventors: Innes K. MacKenzie, Robert J. Stone