Abstract: Position sensor circuits are disclosed for use with variable reluctance sensors. Variable reluctance sensors are described for linear, angular and rotary position measurement and for acceleration measurement.
Abstract: A scintillator for an electron microscope includes a substrate (24) of optically transparent material in disc shaped form, a retaining ring (20) of highly conductive material having a non-oxidizing surface around the substrate and having a radially inwardly extending lip (22) on one end, a coating of indium tin oxide (26) on surface (28) of the substrate, electrically conductive adhesive material (32) between the lip and the radially outer part of the coating, and scintillator material (36) bonded to surface (38) of the coating. The indium tin oxide coating may be applied by sputtering and the scintillator material may br deposited onto the coating by settlement deposition. All contacting surfaces are intimately bonded to provide maximum conductivity resulting in better signal to noise ratio. The conductive substrate minimizes pinhole interference, the scintillator is easier to handle during installation and no aluminum overcoating is required.
Abstract: A scintillator for an electron microscope includes a substrate (24) of optically transparent material in disc shaped form, a retaining ring (20) of highly conductive material having a non-oxidizing surface around the substrate and having a radially inwardly extending lip (22) on one end , a coating of indium tin oxide (26) on surface (28) of the substrate, electrically conductive adhesive material (32) between the lip and the radially outer part of the coating, and scintillator material (36) bonded to surface (38) of the coating. The indium tin oxide coating may be applied by sputtering and the scintillator material may br deposited onto the coating by settlement deposition. All contacting surfaces are intimately bonded to provide maximum conductivity resulting in better signal to noise ratio. The conductive substrate minimizes pinhole interference, the scintillator is easier to handle during installation and no aluminum overcoating is required.
Abstract: A method and apparatus for testing the bond strength of materials such as a coating (101) on a substrate (100) wherein a stub (102) is placed on the coating (101) with a light curable adhesive (114) therebetween, the stub having a threaded section extending upwardly and being made of light transparent material, or a material that is at least partly transparent, a high intensity light (111) is positioned over the stub and operated to irradiate the adhesive through the stub to cure the adhesive, after which a force is applied to the stub in a direction normal to the coating tending to separate the coating from the substrate and is measured to determine the amount of force required. The apparatus includes a stand off ring (23) positioned around the stub for supporting cylinder housing (1) in spaced relationship to the coating, the housing having a cavity therein formed by inner (7) and outer (3) walls and a lower plate for receiving piston (9) therein retained by reaction plate (14).
Type:
Grant
Filed:
August 18, 2000
Date of Patent:
September 4, 2001
Assignee:
M. E. Taylor Engineering, Inc.
Inventors:
Myron Eugene Taylor, Jr., Jon Allen Massey