Patents Assigned to Tech-Metrics International, Inc.
  • Patent number: 6161101
    Abstract: Method and apparatus for computer-aided assessment of organizational process or system. Method and apparatus are adapted to display questions on a computer to an assessor, who then inputs numerical and/or textual inputs relative to the assessor's perception of the process or system. Filtering techniques inhibit entry of unsupported numerical and/or textual inputs which may be untrue and/or exaggerated. Questions used in combination with additional questions provide more accurate assessment of the system or process, where the question combinations are already existing in a database. Evaluations of collected information are performed and additional corrective action questions are asked to identify degrees of risk and areas of weakness of the process or system.
    Type: Grant
    Filed: April 7, 1998
    Date of Patent: December 12, 2000
    Assignee: Tech-Metrics International, Inc.
    Inventors: Lawrence R. Guinta, Lori A. Frantzve
  • Patent number: 6092060
    Abstract: Method and apparatus for computer-aided assessment of organizational process or system. Method and apparatus are adapted to display computer displayed questions to an assessor, who then inputs numerical inputs relative to the assessor's perception of the process or system. Filtering techniques inhibit entry of unsupported numerical inputs which may be untrue and/or exaggerated. Sequential questions used in combination provide more accurate assessment of the system or process, thereby enabling focused audits and/or inspections.
    Type: Grant
    Filed: April 6, 1998
    Date of Patent: July 18, 2000
    Assignee: Tech-Metrics International, Inc.
    Inventors: Lawrence R. Guinta, Lori A. Frantzve
  • Patent number: 5737494
    Abstract: Method and apparatus for computer-aided assessment of organizational process or system. Method and apparatus are adapted to display computer displayed questions to an assessor, who then inputs numerical inputs relative to the assessor's perception of the process or system. Filtering techniques inhibit entry of unsupported numerical inputs which may be untrue and/or exaggerated. Sequential questions used in combination provide more accurate assessment of the system or process, thereby enabling focused audits and/or inspections.
    Type: Grant
    Filed: December 8, 1994
    Date of Patent: April 7, 1998
    Assignee: Tech-Metrics International, Inc.
    Inventors: Lawrence R. Guinta, Lori A. Frantzve