Patents Assigned to Technodream21 Inc.
  • Patent number: 7724379
    Abstract: It is possible to measure a 3-dimensional shape by using a projector and an imaging device without requiring calibration in advance. A pattern light is applied from a projector to an object and this is imaged by an imaging device to capture an image as an input. An in-camera parameter, an in-projector parameter, a parameter of positional relationship between the camera and the projector are estimated. By using the estimation results, a 3-dimensional shape of the object is measured. When a laser pointer is attached to the projector and a laser is applied to the object for capturing an image as an input, scaling of the object shape can also be estimated. Moreover, when measuring a plurality of objects or measuring the same objects a plurality of times, the accuracy of the 3-dimensional shape respectively obtained can be increased by simultaneously processing the inputs.
    Type: Grant
    Filed: May 12, 2005
    Date of Patent: May 25, 2010
    Assignee: Technodream21, Inc.
    Inventors: Hiroshi Kawasaki, Ryo Furukawa
  • Publication number: 20090097039
    Abstract: It is possible to measure a 3-dimensional shape by using a projector and an imaging device without requiring calibration in advance. A pattern light is applied from a projector to an object and this is imaged by an imaging device to capture an image as an input. An in-camera parameter, an in-projector parameter, a parameter of positional relationship between the camera and the projector are estimated. By using the estimation results, a 3-dimensional shape of the object is measured. When a laser pointer is attached to the projector and a laser is applied to the object for capturing an image as an input, scaling of the object shape can also be estimated. Moreover, when measuring a plurality of objects or measuring the same objects a plurality of times, the accuracy of the 3-dimensional shape respectively obtained can be increased by simultaneously processing the inputs.
    Type: Application
    Filed: May 12, 2005
    Publication date: April 16, 2009
    Applicant: TECHNODREAM21, INC.
    Inventors: Hiroshi Kawasaki, Ryo Furukawa
  • Patent number: 7342669
    Abstract: A three-dimensional shape is measured by a simple system structure. A three-dimensional shape measuring instrument comprises a device (1-1) in which a light-emitting diode (1-1b) is installed as a marker in a line laser light source (1-1a), an imaging device (1-2), and a computer (1-3). For measurement, a line laser beam from the device (1-1) is applied to an object (1-4) to be measured, the imaging device (1-2) images the applied line laser beam (1-5) and the light-emitting diode, and a three-dimensional shape is obtained from the image data by triangulation by means of the computer (1-3).
    Type: Grant
    Filed: November 13, 2003
    Date of Patent: March 11, 2008
    Assignee: Technodream21 Inc.
    Inventors: Hiroshi Kawasaki, Ryo Furukawa
  • Publication number: 20060055943
    Abstract: A three-dimensional shape is measured by a simple system structure. A three-dimensional shape measuring instrument comprises a device (1-1) in which a light-emitting diode (1-1b) is installed as a marker in a line laser light source (1-1a), an imaging device (1-2), and a computer (1-3). For measurement, a line laser beam from the device (1-1) is applied to an object (1-4) to be measured, the imaging device (1-2) images the applied line laser beam (1-5) and the light-emitting diode, and a three-dimensional shape is obtained from the image data by triangulation by means of the computer (1-3).
    Type: Application
    Filed: November 13, 2003
    Publication date: March 16, 2006
    Applicant: TECHNODREAM21 INC.
    Inventors: Hiroshi Kawasaki, Ryo Furukawa