Abstract: A testing head having vertical probes is presented. The testing head a first and a second plate-like holder provided with respective guide holes, a contact probe adapted to be received in the guide holes and having a contact tip adapted to establish mechanical and electrical contact to a corresponding contact pad of an integrated electronic device to be tested, the contact probe being deformed in a deflection region located between the plate-like holders as the contact tip abuts onto the contact pad. The contact probe further comprises a rigid arm extending laterally from a body of the contact probe and terminating in the contact tip, the rigid arm being adapted to offset the contact point of the contact probe with the corresponding contact pad with respect to a longitudinal axis of the contact probe.

Abstract: A testing head having cantilever probes is presented. The testing head, comprises a backing ring and a resin holder attached to the backing ring, as well as a plurality of contact probes held by the resin holder and formed with respective contact tips arranged to mechanically and electrically contact a plurality of contact pads of at least one device to be tested. The holder is formed with at least one suitably shaped outline to allow different probe rows to emerge in a cantilever manner.

Abstract: A contact probe for a testing head is described. The probe has at least a pointed rod-shaped body having a crook-shaped section capable to contact mechanically and electrically at least one contact pad of an electronic device to be tested and defined form an elbow point on the rod-shaped body. The rod-shaped body comprises at least one additional elbow point spaced form the elbow point and defining a concave angle in the rod-shaped body.

Abstract: A testing head for microstructures is presented. The testing head includes a top guide plate and bottom guide plate, separated by an air gap. Each of the plates include respective guide holes for accommodating a contact probe having a contact tip that is arranged to mechanically and electrically contact a contact pads on a device under test. The contacting tip of the testing head has a non-zero pitch angle (&agr;OUT) relative to the contact pad, and “scrubs” the pad as the device under test is drawn against the contacting tip, causing the contact probe to bend within the air gap.

Abstract: A testing head having vertical probes is presented. The testing head comprises a guide plate having a guide hole formed therethrough, for accommodating a contact probe having a contact tip that is arranged to mechanically and electrically contact a contact pads on a device under test. The contact probe has a pre-deformed section placed in a flexion region between the guide plate and the test device, arranged to further deform as the contact pad of the test device is drawn against the contacting tip.