Abstract: Provided is a test circuit configured to receive an inspection command from automatic test equipment (ATE) and test a device under test (DUT), and the test circuit includes a plurality of analog inspection circuits electrically connected to the DUT to test an operation thereof, and a digital control circuit configured to control operations of the analog inspection circuits, wherein the digital control circuit and the analog inspection circuits are located apart from each other.

Abstract: A switch IC includes a plurality of cores, each of the cores including a plurality of channels, each of the channels being connected to a device under test (DUT), a command decoder configured to receive an identifier (ID) and a command, decode the ID and the command, and form a control signal for control of the cores and the channels, and a selector configured to provide a signal for control of activation of the cores and the channels to correspond to the control signal output by the command decoder, wherein the command includes switch IC selection data, OP CODE, core selection data, and channel selection data in one frame, and is a command encoded to hierarchically control the plurality of cores and the plurality of channels.