Abstract: The invention relates to a metrology device for determining the quality of a hygroscopic material. The metrology device includes a frame, a support element, two tips that can move in translation with respect to the frame, means for measuring a penetration effort of each tip as a function of a force applied to each tip, means for measuring an electrical resistivity between the ends of the two tips, which means are able to measure an electrical resistivity of the hygroscopic material when the two tips are inserted into the hygroscopic material, and means for measuring a penetration effort of the support element as a function of a force applied to the support element in order to achieve a predetermined fixing position. The support element is adapted to penetrate into the hygroscopic material so as to fix the frame to the hygroscopic material.

Abstract: The invention relates to a metrology device for determining the quality of a hygroscopic material. The metrology device includes a frame, a support element, two tips that can move in translation with respect to the frame, means for measuring a penetration effort of each tip as a function of a force applied to each tip, means for measuring an electrical resistivity between the ends of the two tips, which means are able to measure an electrical resistivity of the hygroscopic material when the two tips are inserted into the hygroscopic material, and means for measuring a penetration effort of the support element as a function of a force applied to the support element in order to achieve a predetermined fixing position. The support element is adapted to penetrate into the hygroscopic material so as to fix the frame to the hygroscopic material.