Patents Assigned to TECSCAN SYSTEMS INC.
  • Patent number: 11717967
    Abstract: A plan for scanning an object using an array of ultrasonic transducers is prepared by identifying one or more enabled transducers for each of a plurality of selected grid positions defined on a surface of the object. The identification is made considering a direction of incidence of a planned ultrasonic signal emitted by each transducer, considering the array being positioned at each of the selected positions, and considering a surface normal vector at a grid position that would be impinged by the planned ultrasonic signal. The scan plan is complete when all grid positions defined on the surface of the array are covered by moving the array to all of the selected grid positions. The scan plan is executed by moving the array according to the scan plan while collecting, by the transducers enabled at each selected grid position, eventual responses to the ultrasonic signals from their respective grid positions.
    Type: Grant
    Filed: November 11, 2021
    Date of Patent: August 8, 2023
    Assignee: TECSCAN SYSTEMS INC.
    Inventors: Nicolas Grimard, Rene Sicard, Sam H. Serhan
  • Patent number: 11692977
    Abstract: An ultrasonic scanner acquires a gain profile including gain values for corresponding travel times in ultrasonic echoes reflected by a reference object. An ultrasonic probe signal is sent toward a test object. In response, an ultrasonic echo reflected by the test object is received at the scanner. A time of arrival of the echo is estimated. The gain profile is aligned with the echo according to the estimated time of arrival of the echo. The echo is amplified using the aligned gain profile and the amplified echo is digitized before being attenuated using the aligned gain profile. An actual time of arrival of the echo is calculated based on the attenuated digitized echo. The gain profile is re-aligned with the attenuated digitized echo according to the actual time of arrival of the echo. The attenuated digitized echo is re-amplified using the re-aligned gain profile to obtain a gain-corrected echo.
    Type: Grant
    Filed: January 14, 2021
    Date of Patent: July 4, 2023
    Assignee: TECSCAN SYSTEMS INC.
    Inventors: Rene Sicard, Nicolas Grimard
  • Patent number: 11022584
    Abstract: A method and an apparatus for scanning a test object are introduced. A reference object is scanned to build a gain correction map including gain values for scanning points on a surface of the reference object. The test object is also scanned to obtain measurements for scanning points on a surface of the test object. Amplitudes of the measurements obtained for the scanning points on the surface of the test object are normalized using the gain values of the gain correction map. The apparatus has a probe mounted on a mechanical scanner, and a controller controlling the scanning and normalizing operations. The method and apparatus can be used to create an image of the test object for non-destructive testing.
    Type: Grant
    Filed: June 27, 2019
    Date of Patent: June 1, 2021
    Assignee: TECSCAN SYSTEMS INC.
    Inventors: Nicolas Grimard, Rene Sicard, Sam H. Serhan
  • Patent number: 10338036
    Abstract: An apparatus for scanning a test object scans a reference object to build a gain correction map including gain values for scanning points on a surface of the reference object. The test object is also scanned to obtain measurements for scanning points on a surface of the test object. Amplitudes of the measurements obtained for the scanning points on the surface of the test object are normalized using the gain values of the gain correction map. The apparatus has a probe mounted on a mechanical scanner, and a controller controlling the scanning and normalizing operations. The apparatus can be used to create an image of the test object for non-destructive testing.
    Type: Grant
    Filed: April 28, 2015
    Date of Patent: July 2, 2019
    Assignee: TECSCAN SYSTEMS INC.
    Inventors: Nicolas Grimard, Rene Sicard, Sam H. Serhan
  • Patent number: 9651525
    Abstract: The present disclosure relates to a method and an apparatus for scanning an object. Two virtual, orthogonal axes are positioned on a surface of the object. A scanning path of a moving probe is controlled as a function of the two virtual, orthogonal axes. The scanning path can include a plurality of probe positions determined according to a desired coverage of the object. A single probe can be used or, optionally, a pair of probes or an array of probes can be used, optionally mounting the probes on a multi-axis movable support. Optionally, a computer-aided design representing the object can be used to parameterize the object. The method and apparatus can be used to create an image of the object for non-destructive testing.
    Type: Grant
    Filed: June 26, 2014
    Date of Patent: May 16, 2017
    Assignee: TECSCAN SYSTEMS INC.
    Inventors: Nicolas Grimard, Rene Sicard, Sam H. Serhan