Abstract: A test and measurement instrument includes a display having a time domain graticule and a frequency domain graticule. A processor is configured to process an input signal to generate a time domain waveform for display in the time domain graticule, the input signal being correlated to a time base. The processor is also configured to process a second input signal and generate a frequency domain waveform for display in the frequency domain graticule, the second input signal being correlated to the same time base. The frequency domain waveform is correlated to a selected time period of the time base. The processor is also configured to generate a spectrum time indicator configured to graphically illustrate a transform parameter, a location and the selected time period in the time domain graticule with respect to the frequency domain waveform.