Abstract: A logic analyzer that performs analog-type measurements on digital data includes circuitry in its acquisition system that is programmable to search through acquired data to detect analog-type signal characteristics. In a first embodiment, the logic analyzer includes a graphical user interface employing a drag-and-drop operation to apply one or more selected analog-type measurements to selected portions of the digital data record. In a second embodiment, a user may designate a particular waveform or data listing by means of a mouse-click. Each of the choices of analog-type measurements can be represented by an icon, or text, or both icon and text.
Type:
Grant
Filed:
May 16, 2006
Date of Patent:
May 13, 2008
Assignee:
Tektronix, Inx.
Inventors:
Robert C. Cohn, Susan C. Adam, Mark A. Briscoe, Andrew Loofburrow, Eric E. Thums