Abstract: An automatic test system that includes low cost and accurate circuitry for generating sinusoidal signals. Each sinusoidal signal generator produces a series of digital values approximating a sine wave. These values are computed, avoiding the need for large memories to store tables representing sine waves. Inaccuracies in the representation of the sine waves do not impact the accuracy of the resultant sine wave because circuitry used to correct for non-linearity errors in a digital-to-analog converter is programmed to also correct for errors introduced by approximating a sine wave with a computed function. A simple parabolic function may be used to compute approximations of a sine wave.

Abstract: A storage device transporter is provided for transporting a storage device and for mounting a storage device within a test slot. The storage device transporter includes a frame that is configured to receive and support a storage device. The storage device transporter also includes a conductive heating assembly that is associated with the frame. The conductive heating assembly is arranged to heat a storage device supported by the frame by way of thermal conduction.

Abstract: A storage device testing system that includes at least one rack, test slots housed by each rack, and at least one air mover in pneumatic communication with the test slots. Each test slot includes a test slot housing having an entrance and an exit, with the entrance configured to receive a storage device. The at least one air mover is configured to move air exterior to the racks into the entrance of each test slot housing, over the received storage device, and out of the exit of each test slot housing.

Abstract: A storage device testing system cooling circuit includes a plurality of test racks. Each of the test racks include a test slot compartment and a test electronics compartment. Each of the test slot compartments includes multiple test slots, and one or more cooling conduits configured to convey a cooling liquid toward the test slots. Each of the test electronics compartments includes test electronics configured to communicate with the test slots for executing a test algorithm, and a heat exchanger in fluid communication with the one or more cooling conduits. The heat exchanger is configured to cool an air flow directed toward the test electronics.

Abstract: A semiconductor device tester includes programmable hardware configured to test a semiconductor device under test. The programmable hardware is programmed with two or more pattern generators to control a flow of data to and from the semiconductor device under test.

Abstract: In one implementation, a method for reducing reconstruction artifacts in a combined image constructed of a multiple images is provided. The method may include identifying pixels in images that are in a selected range. The identified pixels are replaced the with a substitute pixel value. The images with the substitute pixel values are combined to form a combined image having reduced reconstruction artifacts.

Abstract: A test slot cooling system for a storage device testing system includes a storage device transporter having first and second portions. The first portion of the storage device transporter includes an air director and the second portion of the storage device transporter is configured to receive a storage device. The test slot cooling system includes a test slot housing defining an air entrance and a transporter opening for receiving the storage device transporter. The air entrance is in pneumatic communication with the air director of the received storage device transporter. The test slot cooling system also includes an air mover in pneumatic communication with the air entrance of the test slot housing for delivering air to the air director. The air director directs air substantially simultaneously over at least top and bottom surfaces of the storage device received in the storage device transporter.

Abstract: A circuit board assembly includes a primary board, and a connector mounted to a mounting location of the primary board. The connector includes compliant conductors, each compliant conductor having a first end and a second end. The connector further includes a connector body supported by the primary board. The connector body constrains the first end of each compliant conductor at the mounting location and the second end of each compliant conductor at an interface location. The connector further includes a movable member which is capable of moving relative to the connector body along an axis extending between the mounting location and the interface location. The movable member is constructed and arranged to control tension of the compliant conductors while the connector body constrains the first end of each compliant conductor at the mounting location and the second end of each compliant conductor at the interface location.

Abstract: A disk drive test slot includes a housing that defines a test compartment for receiving and supporting a disk drive transporter carrying a disk drive for testing. The housing also defines an open end that provides access to the test compartment for insertion and removal of disk drive transporter carrying a disk drive for testing. The disk drive test slot also includes a mounting plate connected to the housing. One or more isolators are disposed between the housing and the mounting plate. The one or more isolators are operable to inhibit transmission of vibrational energy between the housing and the mounting plate.

Abstract: An automatic test system that can be configured to perform any of a number of test processes. The test system contains multiple functional modules that are interconnected by a network. By using software to configure data flow between functional modules, combinations of modules can be made, thereby creating virtual instruments. As test requirements change, the test system can be reconfigured to contain other virtual instruments, eliminating or reducing the need to add instruments to meet changing test requirements. To ensure adequate performance of the test system, a proposed configuration may be simulated, and if a virtual instrument does not provide a required level of performance, the test system may be reconfigured.

Abstract: A storage device processing system that includes at least one automated transporter, at least one rack accessible by the at least one automated transporter, and multiple test slots housed by the at least one rack. Each test slot is configured to receive a storage device for testing. The storage device processing system includes a conveyor arranged in a loop around and being accessible by the at least one automated transporter. The conveyor receives and transports the storage device thereon. The at least one automated transporter is configured to transfer the storage device between the conveyor and one of the test slots of the at least one rack.

Abstract: A method of controlling a temperature of a test slot in a disk drive testing system includes regulating temperature changes of a subject test slot based on one or more operating conditions of one or more other test slots neighboring the subject test slot.

Abstract: In one implementation, a method of testing multiple DUTs using a single tester channel is provided which includes providing an input signal with the single tester channel simultaneously to each of the DUTs. The method further includes providing a clock signal to each of the DUTs. The clock signal provided to each of the DUTs may be successively delayed clock signals, which are provided to successive DUTs. The method includes using the clock signal to cause a next DUTs to provide an output transition before an output of a prior DUT is returned to a pre-transition state. The method further includes detecting with the single tester channel the output transition of each of the DUTs in response to the input signal and the clock signal.

Abstract: An automatic test system that includes low cost and accurate circuitry for generating sinusoidal signals. Each sinusoidal signal generator includes a look-up table that can, for each phase on sine wave, output two digital values representing an in-phase and a quadrature-phase value of the sine wave. Simple circuitry can be used to address the look-up table to output in-phase and quadrature-phase values. The in-phase and quadrature-phase values can be applied to down-stream circuitry, such as error correction circuitry, that uses an in-phase and a quadrature-phase value to process the sine wave without the need for a relatively complex phase shifter in the down-stream circuitry. A dual-port memory may be used to implement the look-up table so that both an in-phase and a quadrature-phase value may be obtained from a single block of memory that stores a representation of a sine wave.

Abstract: A method for use with automatic test equipment (ATE) includes programming the ATE to generate bursts, each of which corresponds to a signal characteristic produced by the ATE, obtaining power levels for the bursts, and determining if the power levels for the bursts correspond to expected power levels for signal characteristics corresponding to the bursts.

Abstract: A method of transferring storage devices within a storage device testing system includes actuating an automated transporter to substantially simultaneously retrieve multiple storage devices presented for testing, and actuating the automated transporter to substantially simultaneously deliver each retrieved storage device to a respective test slot of the storage device testing system and substantially simultaneously insert each storage device in the respective test slot.

Abstract: An embodiment of the present invention provides a system for detecting a phase-shifted signal at high frequencies in data and clock recovery circuitry. An up-pulse generator, in one embodiment, provides output pulses having a duration exceeding the duration of input pulses upon detection of a phase-shifted signal leading the reference signal. A down-pulse generator provides output pulses having a duration exceeding the duration of input pulses upon detection of a phase-shifted signal lagging the reference signal.

Abstract: Methods and systems for modulating a signal are described. A phase-modulated signal that includes a sequence of contiguous one-cycle sinusoidal waveforms having a frequency above 50 MHz is generated. The phases of the one-cycle sinusoidal waveforms correspond to symbols of a message signal. A bandwidth of the phase-modulated signal is reduced using a bandpass filter centered at the frequency of the contiguous one-cycle sinusoidal waveforms. The phase-modulated signal is wirelessly transmitted.

Abstract: A test slot cooling system for a storage device testing system includes a storage device transporter having first and second portions. The first portion of the storage device transporter includes an air director and the second portion of the storage device transporter is configured to receive a storage device. The test slot cooling system includes a test slot housing defining an air entrance and a transporter opening for receiving the storage device transporter. The air entrance is in pneumatic communication with the air director of the received storage device transporter. The test slot cooling system also includes an air mover in pneumatic communication with the air entrance of the test slot housing for delivering air to the air director. The air director directs air substantially simultaneously over at least top and bottom surfaces of the storage device received in the storage device transporter.

Abstract: A switching topology for communicating signals in an automatic test system includes a plurality of switching circuits each for selectively passing signals or crossing signals. Switching circuits are connected together such that each node of any switching circuit connects to no more than one node of any other switching circuit. This topology offers improved signal integrity, reduced cost, and reduced space as compared with conventional, matrix-style switching topologies.