Abstract: A test system for testing a device having a plurality of electrical contacts. The test system comprising: a device table operable to hold at least one device under test, a probe comprising at least one probe end for contacting electrical contacts of a device under test, a movement mechanism operable to move one or both of the device table and the probe so as to bring the at least one probe end into contact with at least one electrical contact of a device under test, and a profile determining system configured to determine a profile of the electrical contacts of a device under test.

Abstract: A method for determining the thickness of a plurality of coating layers. The method comprises the steps of performing a calibration analysis on calibration data to determine initial values and search limits of optical parameters of the plurality of coating layers, irradiating the plurality of layers with a pulse of THz radiation in the range from 0.01 THz to 10 THz, detecting the reflected radiation to produce a sample response derived from the reflected radiation, producing a synthesized waveform using the optical parameters and predetermined initial thicknesses of the layers, varying the thicknesses and the optical parameters within the search limits to minimize the error measured between the sample response and the synthesized waveform, and outputting the thicknesses of the layers.

Abstract: A reflectometer for allowing a test of a device, the reflectometer comprising: a source of pulsed radiation; a first photoconductive element configured to output a pulse in response to irradiation from the pulsed source; a second photoconductive element configured to receive a pulse; and a transmission line arrangement configured to direct the pulse from the first photoconductive element to the device under test and to direct the pulse reflected from the device under test to the second photoconductive element. At least one of the first and second photoconductive elements is provided on a different substrate to that of the transmission line arrangement.

Abstract: A reflectometer for allowing a test of a device, the reflectometer comprising: a source of pulsed radiation; a first photoconductive element configured to output a pulse in response to irradiation from the pulsed source; a second photoconductive element configured to receive a pulse; and a transmission line arrangement configured to direct the pulse from the first photoconductive element to the device under test and to direct the pulse reflected from the device under test to the second photoconductive element. At least one of the first and second photoconductive elements is provided on a different substrate to that of the transmission line arrangement.

Abstract: A test system for testing a device having a plurality of electrical contacts. The test system comprising: a device table operable to hold at least one device under test, a probe comprising at least one probe end for contacting electrical contacts of a device under test, a movement mechanism operable to move one or both of the device table and the probe so as to bring the at least one probe end into contact with at least one electrical contact of a device under test, and a profile determining system configured to determine a profile of the electrical contacts of a device under test.

Abstract: A test system for testing a device having a plurality of electrical contacts. The test system comprising: a device table operable to hold at least one device under test, a probe comprising at least one probe end for contacting electrical contacts of a device under test, a movement mechanism operable to move one or both of the device table and the probe so as to bring the at least one probe end into contact with at least one electrical contact of a device under test, and a profile determining system configured to determine a profile of the electrical contacts of a device under test.

Abstract: A reflectometer for allowing a test of a device. The reflectometer comprises a source of pulsed radiation, a first photoconductive element configured to output a pulse in response to irradiation from the pulsed source, a second photoconductive element configured to receive a pulse, a transmission line arrangement configured to direct the pulse from the first photoconductive element to the device under test and to direct the pulse reflected from the device under test to the second photoconductive element, and a termination resistance provided for the transmission line configured to match the impedance of the transmission line.

Abstract: A method for determining the thickness of a plurality of coating layers, the method comprising: performing a calibration analysis on calibration data to determine initial values and search limits of optical parameters of said plurality of coating layers, irradiating the said plurality of layers with a pulse of THz radiation, said pulse comprising a plurality of frequencies in the range from 0.01 THz to 10 THz; detecting the reflected radiation to produce a sample response said sample response being derived from the reflected radiation; producing a synthesised waveform using the optical parameters and predetermined initial thicknesses of said layers; and varying said thicknesses and varying said optical parameters within the said search limits to minimise the error measured between the sample response and the synthesised waveform; and outputting the thicknesses of the layers.

Abstract: A transmission line arrangement having a first end and a second end, the transmission line arrangement being configured to transmit a signal between the first end and the second end, the transmission line arrangement comprising a signal conductor extending between the first end and the second end of the transmission line arrangement, a first conducting sheet and a second conducting sheet positioned on two opposing sides of the signal conductor, an insulating material separating the first and second conducting sheets from the signal conductor and a plurality of pieces of conducting material extending between the first and second conducting sheets and arranged at different positions between the first and second ends of the transmission line arrangement, wherein the pieces of conducting material and the conducting sheets are arranged to substantially surround the signal conductor for at least part of its length between the first and second ends of the transmission line arrangement.

Abstract: A transmission line arrangement having a first end and a second end, the transmission line arrangement being configured to transmit a signal between the first end and the second end, the transmission line arrangement comprising a signal conductor extending between the first end and the second end of the transmission line arrangement, a first conducting sheet and a second conducting sheet positioned on two opposing sides of the signal conductor, an insulating material separating the first and second conducting sheets from the signal conductor and a plurality of pieces of conducting material extending between the first and second conducting sheets and arranged at different positions between the first and second ends of the transmission line arrangement, wherein the pieces of conducting material and the conducting sheets are arranged to substantially surround the signal conductor for at least part of its length between the first and second ends of the transmission line arrangement.

Abstract: A test system for testing a device having a plurality of electrical contacts. The test system comprising: a device table operable to hold at least one device under test, a probe comprising at least one probe end for contacting electrical contacts of a device under test, a movement mechanism operable to move one or both of the device table and the probe so as to bring the at least one probe end into contact with at least one electrical contact of a device under test, and a profile determining system configured to determine a profile of the electrical contacts of a device under test.

Abstract: A range of technique for investigating a sample such as obtaining images and/or spectral information are described. The techniques include a method for deriving structural information about a sample as a continuous function of the depth below the surface of the sample, a method for evaluating a part of the structure of a sample located between two interfaces within the sample, and a contrast enhancing method and apparatus which has a quick image acquisition time.

Abstract: A reflectometer for allowing a test of a device, the reflectometer comprising: a source of pulsed radiation; a first photoconductive element configured to output a pulse in response to irradiation from said pulsed source; a second photoconductive element configured to receive a pulse; a transmission line arrangement configured to direct the pulse from the first photoconductive element to the device under test and to direct the pulse reflected from the device under test to the second photoconductive element; and a termination resistance provided for said transmission line configured to match the impedance of the transmission line.

Abstract: Imaging techniques of pharmaceutical preparations such as tablets are disclosed. The techniques combine the measurement of reflected/transmitted terahertz radiation originating from within the tablet and data analysis localized in frequency and time in order to enable a three dimensional image indicating composition to be obtained.

Abstract: A method of performing dissolution analysis on a tablet, the method comprising: irradiating a tablet with radiation having at least one frequency in the range from 40 GHz to 100 THz; detecting radiation which has been transmitted through or reflected by the tablet; determining a parameter from the detected radiation indicative of the density of a coating layer of the tablet; and determining information about the dissolution characteristics of the tablet from said parameter.

Abstract: A probe array (1) for an imaging system for examining an object (19) comprising at least one emitter (7) for emitting radiation, a plurality of detectors (9) for detecting radiation and means for directing radiation emitted by the at least one emitter (7) to the object (19) and for directing radiation reflected from the object (19) to at least two of the plurality of detectors (9) wherein in use the emitted radiation is scanned by means (21) across the object (19).

Abstract: A THz radiation probe (1) for examining an object (8), the probe comprising a first portion configured to be inserted into an opening of said object in a first direction (5), said probe further comprising at least one THz emitter (15), directing means (7) for directing THz radiation emitted from said emitter to said object via an aperture (2) located at said first portion and subsequently from said object to at least one THz detector (17) and, means for scanning said emitted THz radiation across said object in a scan direction, said scan direction having a component in said first direction (5).

Abstract: Method and apparatus for investigating a sample particularly a pharmaceutical tablet. An emitter and/or the sample are initially positioned so that the emitter is at a predetermined distance and normal angle to a first point on a surface of the sample. The emitter then irradiates the sample with radiation having a plurality of frequencies in the range from 25 GHz to 100 THz at a plurality of points on the surface of the sample. Relative motion is possible between the emitter and the sample so that the surface of the sample can be tracked to maintain the predetermined distance and normal angle at each of the plurality of points, and allow radiation transmitted and/or reflected from the sample at the plurality of points to be detected. This has particular application to imaging the structure or composition of a coating on a pharmaceutical tablet.

Abstract: A reflectometer for allowing a test of a device, the reflectometer comprising: a source of pulsed radiation; a first photoconductive element configured to output a pulse in response to irradiation from said pulsed source; a second photoconductive element configured to receive a pulse; a transmission line arrangement configured to direct the pulse from the first photoconductive element to the device under test and to direct the pulse reflected from the device under test to the second photoconductive element; and a termination resistance provided for said transmission line configured to match the impedance of the transmission line.

Abstract: A system for investigating a plurality of samples having varying positions or orientations moving with respect to the system, the system including an emitter of terahertz radiation for irradiating a sample provided in a sample space; a detector of terahertz radiation configured to detect radiation reflected from said sample space; and determining means to determine if radiation reflected from said sample space is from a sample with a predetermined orientation in the sample space.