Patents Assigned to Terrasee Tech, LLC
  • Patent number: 12235403
    Abstract: A method includes determining a current magnetic field strength at a test location above a quantity of material buried at the test location, passing a direct current through a coil of an antenna to induce a magnetic polarity within a range with the determined magnetic field strength, transmitting a test signal with a fundamental frequency from an antenna at the test location, and detecting, at the test location, a reflected wave comprising the test fundamental frequency on the antenna. The method includes varying the test fundamental frequency while retransmitting the test signal and detecting a reflected wave until reflected waves of various test frequencies are detected and identifying from the detected reflected waves a resonant frequency corresponding to a maximum magnitude of the detected reflected waves. The material includes molecules with a resonant atom and at least one atom different than the resonant atom.
    Type: Grant
    Filed: June 22, 2023
    Date of Patent: February 25, 2025
    Assignee: Terrasee Tech, LLC
    Inventor: Philip Clegg
  • Patent number: 11726227
    Abstract: A method for calculating a magnetic influence factor (MIF) between an atom and a resonant atom of a molecule of a material includes determining a current magnetic field strength at a test location above a quantity of material buried at the test location, transmitting a test signal from an antenna at the test location, the test signal comprising a test fundamental frequency, and detecting, at the test location, a reflected wave comprising the test fundamental frequency on the antenna. The method includes varying the test fundamental frequency while retransmitting the test signal and detecting a reflected wave until reflected waves of various test frequencies are detected and identifying from the detected reflected waves a resonant frequency corresponding to a maximum magnitude of the detected reflected waves. The material includes molecules with a resonant atom and at least one atom different than the resonant atom.
    Type: Grant
    Filed: June 17, 2022
    Date of Patent: August 15, 2023
    Assignee: Terrasee Tech, LLC
    Inventor: Philip Clegg
  • Patent number: 11675101
    Abstract: A method for determining depth of a material is disclosed. The method includes transmitting a signal from an antenna at a location. The signal includes a fundamental frequency and the signal penetrates ground under the location. The location is selected to locate a material at a depth under the location. The fundamental frequency matches a known resonant frequency of a resonant atom of a molecule of the material. The method includes detecting a reflected wave on the antenna, determining a time difference between transmission of the signal and detection of the reflected wave on the antenna, and determining the depth to the material based on the time difference and a reflected velocity corresponding to the resonant atom.
    Type: Grant
    Filed: June 17, 2022
    Date of Patent: June 13, 2023
    Assignee: Terrasee Tech, LLC
    Inventor: Philip Clegg