Abstract: A method of calibrating a coordinate measuring machine in which the immutable parameters of the articulated probe head are determine and stored at factory, while the connection parameters and other parameters dependent on the configuration of the system are determined in-situ, with a calibration artifact. The process builds a mathematical model that is the composition of an immutable factory-determined model with the in-situ model. The immutable model can be stored in a non-volatile memory physically provided in the articulated head. The method can fall back to a correction look up table for certain selected orientations of the probe where improved accuracy is needed.

Abstract: An absolute position encoder for a measuring instrument, comprising a digital scale and a reader movable relative to the digital scale. The digital scale is arranged along a travel direction of the reader. The digital scale comprises at least one absolute position track having a sequence of discrete regions sharply separated from each other by separating regions. The reader comprises a first and a second series of detectors configured to sense the discrete regions and separating regions to detect at least one of a first and a second absolute position code. The sequence of discrete regions and the first and second series of detectors are disposed such that none of the detectors of at least one of said first and second series of detectors is aligned with a transition between a discrete region and a separating region at each possible position of the reader relative to the digital scale.

Abstract: A portable measuring device having: a measuring apparatus comprising a logic circuit and a reader, an accessory interchangeably connectable to the measuring apparatus and storing individual metrology information relative to the accessory in a form compatible with the reader, wherein the measuring apparatus is configured, while it is connected to the accessory, to: read the individual calibration information with the reader; acquire, using the accessory, a signal dependent from a metrology-related property of an object; convert the signal into a measure value in the logic circuit, using the individual metrology information of the accessory; output the measure value.

Abstract: Disclosed herein is a contactless sensing unit for a measuring apparatus or machine tool 1, notably for a coordinate measuring machine (CMM). The contactless sensing unit comprises an optical probe device, a coupling element for mechanical connection to a complementary coupling element on the measuring apparatus or machine tool and a housing for housing the optical probe device. The housing is mechanically connected to the coupling element. The optical probe device comprises an optical objective at a distal end of a lower portion of the probe device for sensing a surface of a workpiece. The contactless sensing unit further comprises a collar for adjusting a relative axial, radial and/or angular position of the optical probe device with respect to a fastening portion of the housing. The collar circumferentially clamps the optical probe device essentially around an upper portion of the optical probe device.

Abstract: A portable measuring device having: a measuring apparatus comprising a logic circuit and a reader, an accessory interchangeably connectable to the measuring apparatus and storing individual metrology information relative to the accessory in a form compatible with the reader, wherein the measuring apparatus is configured, while it is connected to the accessory, to: read the individual calibration information with the reader; acquire, using the accessory, a signal dependent from a metrology-related property of an object; convert the signal into a measure value in the logic circuit, using the individual metrology information of the accessory; output the measure value.

Abstract: An articulating probe head for a coordinate measuring machine (CMM) comprising an optical fiber and an interface for automatic connection to an optical coordinate probe. A tool rack for a CMM for storing tactile and/or optical probes for automatic exchange on the said probe head. Two methods are also described to verify the quality of the optical waveguide from controller to the probe tip.