Patents Assigned to Test Acuity Solutions
  • Patent number: 8788237
    Abstract: Methods and apparatus for data analysis according to various aspects of the present invention are configured to identify statistical outliers in test data for components, including hybrid outliers representing outliers within subsets of larger data populations. A method and apparatus according to various aspects of the present invention may operate in conjunction with a test system having a tester, such as automatic test equipment (ATE) for testing semiconductors.
    Type: Grant
    Filed: March 29, 2013
    Date of Patent: July 22, 2014
    Assignee: Test Acuity Solutions
    Inventors: Emilio Miguelanez, Greg LaBonte