Patents Assigned to Test Acuity Solutions, Inc.
  • Methods and apparatus for hybrid outlier detection
    Patent number: 8606536
    Abstract: Methods and apparatus for data analysis according to various aspects of the present invention are configured to identify statistical outliers in test data for components, including hybrid outliers representing outliers within subsets of larger data populations. A method and apparatus according to various aspects of the present invention may operate in conjunction with a test system having a tester, such as automatic test equipment (ATE) for testing semiconductors.
    Type: Grant
    Filed: October 15, 2009
    Date of Patent: December 10, 2013
    Assignee: Test Acuity Solutions, Inc.
    Inventors: Emilio Miguelanez, Greg I. LaBonte
  • Methods and apparatus for local outlier detection
    Patent number: 8417477
    Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to identify statistical outliers in test data for components, including local outliers representing outliers within subsets of larger data populations.
    Type: Grant
    Filed: May 20, 2005
    Date of Patent: April 9, 2013
    Assignee: Test Acuity Solutions, Inc.
    Inventors: Emilio Miguelanez, Jacky Gorin, Eric Paul Tabor