Patents Assigned to Test Advantage, Inc.
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Patent number: 8041541Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a fabrication process for components based on test data for the components.Type: GrantFiled: March 27, 2007Date of Patent: October 18, 2011Assignee: Test Advantage, Inc.Inventors: Paul M. Buxton, Eric Paul Tabor, Emilio Miguelanez Martin, Ali M. S. Zalzala
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Patent number: 8000928Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically select one or more outlier identification algorithms for identifying statistical outliers in test data for components.Type: GrantFiled: April 29, 2008Date of Patent: August 16, 2011Assignee: Test Advantage, Inc.Inventors: Michael J. Scott, Jacky Gorin, Paul Buxton, Eric Paul Tabor
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Patent number: 7904279Abstract: Methods and apparatus for data analysis according to various aspects of the present invention identify statistical outliers in data, such as test data for components. The outliers may be identified and categorized according to the distribution of the data. In addition, outliers may be identified according to multiple parameters, such as spatial relationships, variations in the test data, and correlations to other test data.Type: GrantFiled: September 19, 2007Date of Patent: March 8, 2011Assignee: Test Advantage, Inc.Inventors: Emilio Miguelanez, Michael J. Scott, Greg LaBonte
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Patent number: 7437271Abstract: A method and apparatus for testing semiconductors according to various aspects of the present invention comprises a test system comprising composite data analysis element configured to analyze data from more than one dataset. The test system may be configured to provide the data in an output report. The composite data analysis element suitably performs a spatial analysis to identify patterns and irregularities in the composite data set. The composite data analysis element may also operate in conjunction with a various other analysis systems, such as a cluster detection system and an exclusion system, to refine the composite data analysis. The composite may also be merged into other data.Type: GrantFiled: October 28, 2005Date of Patent: October 14, 2008Assignee: Test Advantage, Inc.Inventor: Eric Paul Tabor
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Patent number: 7395170Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically select one or more outlier identification algorithms for identifying statistical outliers in test data for components.Type: GrantFiled: April 2, 2004Date of Patent: July 1, 2008Assignee: Test Advantage, Inc.Inventors: Michael J. Scott, Jacky Gorin, Paul Buxton, Eric Paul Tabor
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Patent number: 7356430Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a component fabrication process guided by characteristics of the test data for the components. A method and apparatus according to various aspects of the present invention may operate in conjunction with a test system having a tester, such as automatic test equipment (ATE) for testing semiconductors.Type: GrantFiled: February 7, 2005Date of Patent: April 8, 2008Assignee: Test Advantage, Inc.Inventors: Emilio Miguelanez, Michael J. Scott, Jacky Gorin, Paul Buxton, Paul Tabor
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Patent number: 7225107Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a fabrication process for components based on test data for the components.Type: GrantFiled: December 7, 2003Date of Patent: May 29, 2007Assignee: Test Advantage, Inc.Inventors: Paul M. Buxton, Eric Paul Tabor, Emilio Miguelanez Martin, Ali M. S. Zalzala
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Patent number: 7167811Abstract: A method and apparatus for testing semiconductors according to various aspects of the present invention comprises a test system comprising composite data analysis element configured to analyze data from more than one dataset. The test system may be configured to provide the data in an output report. The composite data analysis element suitably performs a spatial analysis to identify patterns and irregularities in the composite data set. The composite data analysis element may also operate in conjunction with a various other analysis systems, such as a cluster detection system and an exclusion system, to refine the composite data analysis. The composite may also be merged into other data.Type: GrantFiled: February 14, 2003Date of Patent: January 23, 2007Assignee: Test Advantage, Inc.Inventor: Eric Paul Tabor
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Patent number: 6792373Abstract: A method and apparatus for testing semiconductors according to various aspects of the present invention comprises a test system comprising an outlier identification element configured to identify significant data in a set of test results. The test system may be configured to provide the data in an output report. The outlier identification element suitably performs the analysis at run time. The outlier identification element may also operate in conjunction with a smoothing system to smooth the data and identify trends and departures from test result norms.Type: GrantFiled: May 24, 2002Date of Patent: September 14, 2004Assignee: Test Advantage, Inc.Inventor: Eric Paul Tabor
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Patent number: 6442499Abstract: Methods and apparatus for statistical process control of test according to various aspects of the present invention optimize the wait period between applying input signals and collecting output test signal data. In one embodiment, a tester identifies one or more acceptable systems, circuit boards, or components and performs testing to establish baseline test data. The systems, circuit boards, or components are then tested using a series of different waiting periods to generate wait time optimization data. The wait time optimization data and the baseline data are then statistically analyzed, for example using statistical process control techniques, to identify a wait period for which the test process is out of control. An optimized wait period is then selected that is suitable to maintain the test process under control.Type: GrantFiled: July 10, 2001Date of Patent: August 27, 2002Assignee: Test Advantage, Inc.Inventor: Jacky Gorin