Abstract: Test fixture for contacting assembled printed circuit boards 3 with a probe plate 1 for holding test probes 5, 19 arranged closely side by side (5, 19), with a first type of test probes 5 held from receptacles 4 inserted into the probe plate 1, into which contact elements 6, 7 are inserted from below towards the test probes 5, and with a smaller diameter second type of test probes 19, which are arranged without receptacles 4 in the probe plate 1 and which are shaped at their lower end as hollow probes for the reception of insertable contact elements 20, 25, the insertable 10 contact elements (20, 25) being fixed in additional assembly-plates 21, 22.

Abstract: Test adapter for testing a loaded circuit board (6), comprising a probe plate (1), on which test probes (3) for the contact of plungers of the test probes (3a) with test points (7) of the circuit board (6) are fixed, and a moving plate (4), with which the circuit board (6) can be coupled by means of locating pins (5), that is arranged between the circuit board (6) and the probe plate (1) and having through bores (8) for the test probes (3). The test adapter further comprises an adjusting device (50-65), by means of which the position of the circuit board (6) is adjustable with regard to the plunger positions of the test probes (3). With a movement of the probe plate (1) towards the circuit board (6), the plungers of the test probes (3) meet the test points on the circuit board (6), and the adjusting device (50-65) affects each locating pin (5) and establishes adjustably the locating pins (5) in the moving plate (4) in a plane parallel to the plane of the circuit board.

Abstract: The invention relates to a test device for component assembly circuit boards (31), in which this test device includes a plurality of test channels which are contact-connected with respective test points (32) of the board (31) by means of spring contact pins (2, 3), whereby in accordance with the invention for the contacting of the spring contact pits with the terminals of the test channels (29) there is provided a raster plate (21) which has contact surfaces (22) on the side to be contacted with the spring contact pins, of which contact surfaces in each case n contact surfaces are electrically parallel-connected with .one another and connected with a respective test channel, whereby the test surfaces (No. 1, No. 2, . . . , No. 21, No. 41, . . . ) of the test channels (a.sub.1, a.sub.2, . . . b.sub.1, . . . c.sub.1, . . .) are positioned on this outer surface of the raster plate distributed mixed with one another.(FIG.

Abstract: An adapter for testing printed circuit boards which has a support plate and an advantageous fixation of exchangeable spring-loaded contact elements, also known as spring-loaded probe assemblies, therein for providing electrical contacts to a printed circuit board in predetermined contact locations. The support plate (2) is comprised of several layers (20, 21, 22), and the contact elements (4) are set into bores (3) and are removably held and axially locked into place in the bores (3) between two layers (20, 22) by a bead (51) formed on the contact elements, preferably in a vacuum-tight manner.