Abstract: A high speed, low mass positioning apparatus is provided for positioning a test probe or other like item at any desired point within an x-y plane. The apparatus comprises a first axis of movement mechanism for positioning the item along one axis of movement and a second axis of movement mechanism for positioning the item along the remaining transverse axis of movement. Both of the axis of movement mechanisms comprise motor driven pulley wheel and drive cable arrangements arrayed around the outer periphery of the x-y planar surface area within which it is desired to position a test probe, tool or other like item. A light inflexible track member is secured between and carried by two spaced-apart movable trucks and is movable therewith in either direction along the said one axis of movement. A small lightweight movable carrier is movably supported on the track member and is movable therealong in either direction.

Abstract: This application describes a novel method and apparatus for the electrical and mechanical inspection and testing of unpopulated electronic printed circuit boards, ceramic substrates and other items which have conductive pathways formed thereon, interconnecting conductive pads and other conducting surfaces. Examination and testing is accomplished by placing a printed circuit board or other item to be tested within a sealed chamber which contains a gaseous atmosphere capable of cathode luminescence such as argon, neon and the like. The sealed chamber includes a transparent panel or partition which allows viewing of the printed circuit board or other item under test and preferably is electrically conductive. One terminal of a source of excitation electric potential is connected to the transparent conductive panel and the other terminal is applied to one of the metallic runs or paths on the surface of the sample item to be tested.