Abstract: The invention is a machine used to test and sort small electronic components. The machine includes a feed station, a testing station and a sorting station. The components are carried between the different stations by a rotatable transport wheel that includes a number of peripherally-located and radially-aligned compartments.The testing station includes a top lead that is moved in a direction away from or toward the central axis of the wheel. The movement is controlled by a follower roller that is connected to the lead and that travels along a surface of a cam ring that is attached to the transport wheel. The testing station further includes a shielding strip that isolates the electronic component from surrounding fields during the testing operation.