Abstract: The present invention relates to an embedded device testing method. Preferably, the present invention relates to a function testing method for an embedded device designed to execute a specific function. The embedded device testing method having a hierarchical host structure executed on a computing device according to the present invention includes: receiving, by a main host, setting information for an execution environment of a target device; constructing a virtualized execution environment on a sub host according to the setting information; executing specific software or a specific test case in the constructed execution environment; and monitoring a result of the execution. According to the present invention, resources may be utilized efficiently because there is no need to newly configure and prepare physical hardware resources every time during the development and testing of an embedded device.

Abstract: The present invention relates to a method for obtaining and registering vision data from LiDARs. The LiDAR data registration method according to the present invention includes: calculating an external matrix for each LiDAR sensor by using normal vectors for a plurality of first planar objects in point cloud data collected from a plurality of LiDAR sensors; extracting a common second planar object in the point cloud data received from each LiDAR sensor for which correction is performed using the external matrix; and performing registration for the plurality of LiDAR sensors by using the extracted second planar object. According to the present invention, it is possible to generate a depth map for a wider region by precisely registering vision data from LiDARs positioned at a distance.