Abstract: Method for measuring a moisture value F of dielectric materials using at least one microwave resonator, one shift A of the resonant frequency being respectively evaluated for at least two resonance modes with resonant frequencies which are different from one another and a density-independent moisture value being calculated from the measured shifts in the resonant frequency.
Type:
Grant
Filed:
July 25, 2008
Date of Patent:
June 28, 2016
Assignee:
TEWS ELECTRONIK DIPL. ING. MANFRED TEWS
Inventors:
Rainer Herrmann, Udo Schlemm, Hendrik Richter
Abstract: Method for measuring a moisture value F of dielectric materials using at least one microwave resonator, one shift A of the resonant frequency being respectively evaluated for at least two resonance modes with resonant frequencies which are different from one another and a density-independent moisture value being calculated from the measured shifts in the resonant frequency.
Type:
Application
Filed:
July 25, 2008
Publication date:
April 21, 2011
Applicant:
TEWS ELECTRONIK DIPL. ING. MANFRED TEWS
Inventors:
Rainer Herrmann, Udo Schlemm, Hendrik Richter