Patents Assigned to Texas Test Corporation
  • Automatic test apparatus for functional digital testing of multiple semiconductor integrated circuit devices
    Publication number: 20160245864
    Abstract: An automatic test apparatus for testing the digital functionality of multiple semiconductor integrated circuit devices simultaneously connected to the apparatus generates data patterns suitable for testing at least one of the devices. Stimulus test signals of the data patterns are replicated and distributed to the devices. Expected response signals of the devices for the test signals are also replicated and distributed to comparators for comparing the actual response of the devices with the expected response.
    Type: Application
    Filed: February 17, 2016
    Publication date: August 25, 2016
    Applicant: Texas Test Corporation
    Inventor: Marc R. Mydill