Patents Assigned to The EUV LLC
  • Patent number: 6561486
    Abstract: A compact, vacuum compatible motorized jack for supporting heavy loads and adjusting their positions is provided. The motorized jack includes: (a) a housing having a base; (b) a first roller device that provides a first slidable surface and that is secured to the base; (c) a second roller device that provides a second slidable surface and that has an upper surface; (d) a wedge that is slidably positioned between the first roller device and the second roller device so that the wedge is in contact with the first slidable surface and the second slidable surface; (e) a motor; and (d) a drive mechanism that connects the motor and the wedge to cause the motor to controllably move the wedge forwards or backwards. Individual motorized jacks can support and lift of an object at an angle. Two or more motorized jacks can provide tip, tilt and vertical position adjustment capabilities.
    Type: Grant
    Filed: October 11, 2001
    Date of Patent: May 13, 2003
    Assignee: EUV LLC
    Inventors: Steven J. Haney, Donald Joe Herron
  • Patent number: 6549264
    Abstract: Control of particle contamination on the reticle and carbon contamination of optical surfaces in photolithography systems can be achieved by the establishment of multiple pressure zones in the photolithography systems. The different zones will enclose the reticle, projection optics, wafer, and other components of system. The system includes a vacuum apparatus that includes: a housing defining a vacuum chamber; one or more metrology trays situated within the vacuum chamber each of which is supported by at least one support member, wherein the tray separates the vacuum chamber into a various compartments that are maintained at different pressures; and conductance seal devices for adjoining the perimeter of each tray to an inner surface of the housing wherein the tray is decoupled from vibrations emanating from the inner surface of the housing.
    Type: Grant
    Filed: November 6, 2001
    Date of Patent: April 15, 2003
    Assignee: EUV LLC
    Inventors: Steven J. Haney, Donald Joe Herron, Leonard E. Klebanoff, William C. Replogle
  • Patent number: 6545745
    Abstract: Control of particle contamination on the reticle and carbon contamination of optical surfaces in photolithography systems can be achieved by the establishment of multiple pressure zones in the photolithography systems. The different zones will enclose the reticle, projection optics, wafer, and other components of system. The system includes a vacuum apparatus that includes: a housing defining a vacuum chamber; one or more metrology trays situated within the vacuum chamber each of which is supported by at least one support member, wherein the tray separates the vacuum chamber into a various compartments that are maintained at different pressures; and conductance seal devices for adjoining the perimeter of each tray to an inner surface of the housing wherein the tray is decoupled from vibrations emanating from the inner surface of the housing.
    Type: Grant
    Filed: November 6, 2001
    Date of Patent: April 8, 2003
    Assignee: EUV LLC
    Inventors: Steven J. Haney, Donald Joe Herron, Leonard E. Klebanoff, William C. Replogle
  • Patent number: 6533952
    Abstract: A process for mitigating or eliminating contamination and/or degradation of surfaces having common, adventitious atmospheric contaminants adsorbed thereon and exposed to radiation. A gas or a mixture of gases is introduced into the environment of a surface(s) to be protected. The choice of the gaseous species to be introduced (typically a hydrocarbon gas, water vapor, or oxygen or mixtures thereof) is dependent upon the contaminant as well as the ability of the gaseous species to bind to the surface to be protected. When the surface and associated bound species are exposed to radiation reactive species are formed that react with surface contaminants such as carbon or oxide films to form volatile products (e.g., CO, CO2) which desorb from the surface.
    Type: Grant
    Filed: December 23, 1999
    Date of Patent: March 18, 2003
    Assignee: EUV LLC
    Inventors: Leonard E. Klebanoff, Richard H. Stulen
  • Patent number: 6498832
    Abstract: It has been demonstrated that debris generation within an electric capillary discharge source, for generating extreme ultraviolet and soft x-ray, is dependent on the magnitude and profile of the electric field that is established along the surfaces of the electrodes. An electrode shape that results in uniform electric field strength along its surface has been developed to minimize sputtering and debris generation.
    Type: Grant
    Filed: March 13, 2001
    Date of Patent: December 24, 2002
    Assignee: EUV LLC
    Inventors: Paul Andrew Spence, Neal Robert Fornaciari, Jim Jihchyun Chang
  • Patent number: 6492067
    Abstract: A removable pellicle for a lithographic mask that provides active and robust particle protection, and which utilizes a traditional pellicle and two deployments of thermophoretic protection to keep particles off the mask. The removable pellicle is removably attached via a retaining structure to the mask substrate by magnetic attraction with either contacting or non-contacting magnetic capture mechanisms. The pellicle retaining structural is composed of an anchor piece secured to the mask substrate and a frame member containing a pellicle. The anchor piece and the frame member are in removable contact or non-contact by the magnetic capture or latching mechanism. In one embodiment, the frame member is retained in a floating (non-contact) relation to the anchor piece by magnetic levitation. The frame member and the anchor piece are provided with thermophoretic fins which are interdigitated to prevent particles from reaching the patterned area of the mask.
    Type: Grant
    Filed: December 3, 1999
    Date of Patent: December 10, 2002
    Assignee: EUV LLC
    Inventors: Leonard E. Klebanoff, Daniel J. Rader, Scott D. Hector, Khanh B. Nguyen, Richard H. Stulen
  • Patent number: 6469827
    Abstract: A condenser system for generating a beam of radiation includes a source of radiation light that generates a continuous spectrum of radiation light; a condenser comprising one or more first optical elements for collecting radiation from the source of radiation light and for generating a beam of radiation; and a diffractive spectral filter for separating first radiation light having a particular wavelength from the continuous spectrum of radiation light. Cooling devices can be employed to remove heat generated. The condenser system can be used with a ringfield camera in projection lithography.
    Type: Grant
    Filed: August 4, 2000
    Date of Patent: October 22, 2002
    Assignee: EUV LLC
    Inventors: William C. Sweatt, Daniel A. Tichenor, Luis J. Bernardez
  • Patent number: 6441885
    Abstract: Thermal distortion of reticles or masks can be significantly reduced by emissivity engineering, i.e., the selective placement or omission of coatings on the reticle. Reflective reticles so fabricated exhibit enhanced heat transfer thereby reducing the level of thermal distortion and ultimately improving the quality of the transcription of the reticle pattern onto the wafer. Reflective reticles include a substrate having an active region that defines the mask pattern and non-active region(s) that are characterized by a surface that has a higher emissivity than that of the active region. The non-active regions are not coated with the radiation reflective material.
    Type: Grant
    Filed: July 10, 2001
    Date of Patent: August 27, 2002
    Assignee: EUV LLC
    Inventors: Steven E. Gianoulakis, Avijit K. Ray-Chaudhuri
  • Patent number: 6396068
    Abstract: An illumination system includes several discharge sources that are multiplexed together to reduce the amount of debris generated.
    Type: Grant
    Filed: October 2, 2000
    Date of Patent: May 28, 2002
    Assignee: EUV LLC
    Inventors: William C. Sweatt, Glenn D. Kubiak
  • Patent number: 6395455
    Abstract: Thermal distortion of reticles or masks can be significantly reduced by emissivity engineering, i.e., the selective placement or omission of coatings on the reticle. Reflective reticles so fabricated exhibit enhanced heat transfer thereby reducing the level of thermal distortion and ultimately improving the quality of the transcription of the reticle pattern onto the wafer. Reflective reticles include a substrate having an active region that defines the mask pattern and non-active region(s) that are characterized by a surface that has a higher emissivity than that of the active region. The non-active regions are not coated with the radiation reflective material.
    Type: Grant
    Filed: July 10, 2001
    Date of Patent: May 28, 2002
    Assignee: EUV LLC
    Inventors: Steven E. Gianoulakis, Avijit K. Ray-Chaudhuri
  • Patent number: 6368942
    Abstract: A method for fabricating masks for extreme ultraviolet lithography (EUVL) using Ultra-Low Expansion (ULE) substrates and crystalline silicon. ULE substrates are required for the necessary thermal management in EUVL mask blanks, and defect detection and classification have been obtained using crystalline silicon substrate materials. Thus, this method provides the advantages for both the ULE substrate and the crystalline silicon in an Extreme Ultra-Violet (EUV) mask blank. The method is carried out by bonding a crystalline silicon wafer or member to a ULE wafer or substrate and thinning the silicon to produce a 5-10 &mgr;m thick crystalline silicon layer on the surface of the ULE substrate. The thinning of the crystalline silicon may be carried out, for example, by chemical mechanical polishing and if necessary or desired, oxidizing the silicon followed by etching to the desired thickness of the silicon.
    Type: Grant
    Filed: March 31, 2000
    Date of Patent: April 9, 2002
    Assignee: EUV LLC
    Inventor: Gregory F. Cardinale
  • Patent number: 6356618
    Abstract: An extreme ultraviolet and soft x-ray radiation electric capillary discharge source that includes a boron nitride housing defining a capillary bore that is positioned between two electrodes one of which is connected to a source of electric potential can generate a high EUV and soft x-ray radiation flux from the capillary bore outlet with minimal debris. The electrode that is positioned adjacent the capillary bore outlet is typically grounded. Pyrolytic boron nitride, highly oriented pyrolytic boron nitride, and cubic boron nitride are particularly suited. The boron nitride capillary bore can be configured as an insert that is encased in an exterior housing that is constructed of a thermally conductive material. Positioning the ground electrode sufficiently close to the capillary bore outlet also reduces bore erosion.
    Type: Grant
    Filed: June 13, 2000
    Date of Patent: March 12, 2002
    Assignee: EUV LLC
    Inventors: Neal R. Fornaciari, Richard E. Nygren, Michael A. Ulrickson
  • Patent number: 6353271
    Abstract: A stage for precise positioning of a chuck in three orthogonal linear axes and in three orthogonal rotation axes that includes first and second subassemblies. The a first subassembly includes (i) a monolithic mirror that supports the chuck wherein the monolithic mirror has at least two polished orthogonal faces for interferometric determination of the X, Y, and &THgr;z positions; (ii) a plurality of electromagnetic actuators that control fine positioning in all six axes and coarse positioning in one axis; (iii) a position sensor for measuring the vertical Z position of the monolithic mirror; and (iv) a Lorentz actuator, that includes magnet array, for effecting motion in the Y axis. The a second subassembly comprising a stepping axis beam over which the first subassembly is suspended, wherein the stepping axis beam includes a drive coil array for the Lorentz actuator.
    Type: Grant
    Filed: October 29, 1999
    Date of Patent: March 5, 2002
    Assignee: EUV, LLC
    Inventor: Mark E. Williams
  • Patent number: 6333775
    Abstract: Control of particle contamination on the reticle and carbon contamination of optical surfaces in photolithography systems can be achieved by the establishment of multiple pressure zones in the photolithography systems. The different zones will enclose the reticle, projection optics, wafer, and other components of system. The system includes a vacuum apparatus that includes: a housing defining a vacuum chamber; one or more metrology trays situated within the vacuum chamber each of which is supported by at least one support member, wherein the tray separates the vacuum chamber into a various compartments that are maintained at different pressures; and conductance seal devices for adjoining the perimeter of each tray to an inner surface of the housing wherein the tray is decoupled from vibrations emanating from the inner surface of the housing.
    Type: Grant
    Filed: January 13, 1999
    Date of Patent: December 25, 2001
    Assignee: EUV LLC
    Inventors: Steven J. Haney, Donald Joe Herron, Leonard E. Klebanoff, William C. Replogle
  • Patent number: 6328282
    Abstract: A compact, vacuum compatible motorized jack for supporting heavy loads and adjusting their positions is provided. The motorized jack includes: (a) a housing having a base; (b) a first roller device that provides a first slidable surface and that is secured to the base; (c) a second roller device that provides a second slidable surface and that has an upper surface; (d) a wedge that is slidably positioned between the first roller device and the second roller device so that the wedge is in contact with the first slidable surface and the second slidable surface; (e) a motor; and (d) a drive mechanism that connects the motor and the wedge to cause the motor to controllably move the wedge forwards or backwards. Individual motorized jacks can support and lift of an object at an angle. Two or more motorized jacks can provide tip, tilt and vertical position adjustment capabilities.
    Type: Grant
    Filed: May 10, 2000
    Date of Patent: December 11, 2001
    Assignee: EUV LLC
    Inventors: Steven J. Haney, Donald Joe Herron
  • Patent number: 6316150
    Abstract: Thermal distortion of reticles or masks can be significantly reduced by emissivity engineering, i.e., the selective placement or omission of coatings on the reticle. Reflective reticles so fabricated exhibit enhanced heat transfer thereby reducing the level of thermal distortion and ultimately improving the quality of the transcription of the reticle pattern onto the wafer. Reflective reticles include a substrate having an active region that defines the mask pattern and non-active region(s) that are characterized by a surface that has a higher emissivity than that of the active region. The non-active regions are not coated with the radiation reflective material.
    Type: Grant
    Filed: August 24, 1998
    Date of Patent: November 13, 2001
    Assignee: EUV LLC
    Inventors: Steven E. Gianoulakis, Avijit K. Ray-Chaudhuri
  • Patent number: 6285737
    Abstract: Condenser system, for use with a ringfield camera in projection lithography, employs quasi grazing-incidence collector mirrors that are coated with a suitable reflective metal such as ruthenium to collect radiation from a discharge source to minimize the effect of contaminant accumulation on the collecting mirrors.
    Type: Grant
    Filed: January 21, 2000
    Date of Patent: September 4, 2001
    Assignee: EUV LLC
    Inventors: William C. Sweatt, Glenn D. Kubiak
  • Patent number: 6285497
    Abstract: Condensers having a mirror with a diffraction grating in projection lithography using extreme ultra-violet significantly enhances critical dimension control. The diffraction grating has the effect of smoothing the illumination at the camera's entrance pupil with minimum light loss. Modeling suggests that critical dimension control for 100 nm features can be improved from 3 nm to less than about 0.5 nm.
    Type: Grant
    Filed: July 13, 2000
    Date of Patent: September 4, 2001
    Assignee: EUV LLC
    Inventors: William C. Sweatt, Avijit Ray-Chaudhuri
  • Patent number: 6279601
    Abstract: A seal assembly that provides a means for establishing multiple pressure zones within a system. The seal assembly combines a plate extending from the inner wall of a housing or inner enclosure that intersects with and is immersed in the fluid contained in a well formed in a tray contained within the enclosure. The fluid is a low vapor pressure oil, chemically inert and oxidation resistant. The use of a fluid as the sealing component provides a seal that is self-healing and mechanically robust not subject to normal mechanical wear, breakage, and formation of cracks or pinholes and decouples external mechanical vibrations from internal structural members.
    Type: Grant
    Filed: May 2, 2000
    Date of Patent: August 28, 2001
    Assignee: EUV LLC
    Inventor: Leonard E. Klebanoff
  • Patent number: 6253464
    Abstract: A system that employs thermophoresis to protect lithographic surfaces from particle deposition and operates in an environment where the pressure is substantially constant and can be sub-atmospheric. The system (thermophoretic pellicle) comprises an enclosure that surrounds a lithographic component whose surface is being protected from particle deposition. The enclosure is provided with means for introducing a flow of gas into the chamber and at least one aperture that provides for access to the lithographic surface for the entry and exit of a beam of radiation, for example, and further controls gas flow into a surrounding low pressure environment such that a higher pressure is maintained within the enclosure and over the surface being protected.
    Type: Grant
    Filed: August 18, 2000
    Date of Patent: July 3, 2001
    Assignee: Euv LLC
    Inventors: Leonard E. Klebanoff, Daniel J. Rader