Patents Assigned to The Head of Agency of Industrial Science and Technology
  • Optical probe, method of manufacturing an optical probe, and scanning probe microscope
    Patent number: 6121604
    Abstract: An optical probe is used in a near-field effect microscope for performing topographical observation and physical property measurement on a surface of a sample. The optical probe comprises an optical resonator having an optical fiber having at least one microscopic projection composed of a dielectric material disposed at an end portion of the optical fiber for transmitting light.
    Type: Grant
    Filed: April 22, 1998
    Date of Patent: September 19, 2000
    Assignees: The Head of Agency of Industrial Science and Technology, Seiko Instruments Inc.
    Inventors: Takashi Hiraga, Tetsuo Moriya, Akihiro Mito, Masamichi Fujihira, Hiroshi Muramatsu, Noritaka Yamamoto