Abstract: The present invention discloses a combined oxygen, nitrogen and hydrogen joint determination device and method based on thermal conductivity-infrared technique. In the device, a melting and extraction system comprises a carrier gas introduction pipeline, a chamber valve, an impulse furnace and a dust filter; an analytical gas transmission system comprises a flush valve, a bypass valve, a mass flowmeter and a first switching valve; a signal detection system comprises an infrared cell, an analysis purification reagent tube and a thermal conductivity cell; and a signal analysis system comprises a controller and a processor. The present invention realizes different joint determination modes by switching different gas paths, which can meet different determination requirements of different users.

Abstract: The present application relates to a method for statistical distribution characterization of dendritic structures in original position of single crystal superalloy, and relates to the technical field of analysis of metal material composition and microstructure, comprising the following steps: step 1, processing a to-be-tested sample and determining a calibration coefficient; step 2, obtaining a two-dimensional element content distribution map of the to-be-tested sample; and step 3, determining the number and average spacing of primary dendrites. A composition distribution region analyzed in the present application is larger than the area of a distribution region of the traditional microscopic analysis method, and the sample preparation is simple. The distribution, number and average spacing of the primary dendrites can be obtained without metallographic corrosion sampling.

Abstract: A high-throughput and small size samples tension, compression, bending test system is disclosed. The system includes a computer unit, a motor and a number of the sample testing modules mounted horizontally or perpendicular to that ground on a workbench. The sample testing modules include a sample testing modules base plate fixedly attached to the workbench, and a ball screw, a displacement sensor, a moving beam, a clamp unit, a linear moving platform unit and a force value sensor arranged on the sample testing modules base plate. A number of the sample testing modules are arrange in parallel on the workbench or uniformly distributed in a circumferential direction with a point on the workbench as a circular center.

Abstract: A measurement deviation correction method and system for spark discharge analysis of a large-size metal material includes: performing line-by-line scanning measurement on a surface of the material to obtain a line component content, performing in-line correction on the line component content by adopting a line linear fitting model, and performing inter-line correction by taking a total average value obtained by eliminating an extreme value from a line component content distribution to obtain an inter-line corrected component content; performing column-by-column scanning measurement on the surface of the material to obtain a column component content, performing in-column correction on the column component content by adopting a column linear fitting model, and performing inter-column correction by taking a total average value obtained by eliminating an extreme value from the column component content; and coupling the inter-line corrected component content and the inter-column corrected component content to obta

Abstract: The present invention discloses an integrated research and development system for high-throughput preparation and statistical mapping characterization of materials, comprising: a high-throughput preparation module, a high-throughput characterization module, an automatic control module and a statistical mapping data processing module; the high-throughput preparation module is used for preparing a multi-component combinatorial-sample; the high-throughput characterization module comprises a plurality of different high-throughput characterization devices; the automatic control module comprises a special sample box, a sample moving platform, an intelligent mechanical arm and a synchronous control system; and the statistical mapping data processing module is used for constructing a statistical mapping constitutive model corresponding to position mapping according to the composition, microstructure and performance data of the combinatorial-sample.

Abstract: The invention belongs to the technical field of quantitative statistical distribution analysis for micro-structures of metal materials, and relates to a method for automatic quantitative statistical distribution characterization of dendrite structures in a full view field of metal materials. According to the method based on deep learning in the present invention, dendrite structure feature maps are marked and trained to obtain a corresponding object detection model, so as to carry out automatic identification and marking of dendrite structure centers in a full view field; and in combination with an image processing method, feature parameters in the full view field such as morphology, position, number and spacing of all dendrite structures within a large range are obtained quickly, thereby achieving quantitative statistical distribution characterization of dendrite structures in the metal material.

Abstract: An apparatus and a method for preparing glow discharge sputtering samples for materials microscopic characterization are provided. The apparatus includes a glow discharge sputtering unit, a glow discharge power supply, a gas circuit automatic control unit, a spectrometer, and a computer. The structure of the glow discharge sputtering unit is optimized to be more suitable for sample preparation by simulation. By adding a magnetic field to the glow discharge plasma, uniform sample sputtering is realized within a large size range of the sample surface. The spectrometer monitors multi-element signal in a depth direction of the sample sputtering, so that precise preparation of different layer microstructures is realized. In conjunction with the acquisition of the sample position marks and the precise spatial coordinates (x, y, z) information, the correspondence between the surface space coordinates and the microstructure of the sample is conveniently realized.

Abstract: The present invention relates to a test system and method capable of simultaneously carrying out a high-throughput test of mechanical properties for miniature specimens. The system comprises one workstation (17) and a plurality of specimen test modules (16) installed horizontally or vertically on a workbench (15), wherein the workstation (17) comprises an operation interface, a data processing unit and a load output unit; each specimen test module (16) comprises a drive unit (5), an interchangeable clamp unit (8), a displacement sensor (2), and a load sensor (14); the workstation (17) controls the drive unit (5) of the specimen test module (16) and receives detection data of the displacement sensor (2) and the load sensor (14); each specimen test module (16) optionally performs mechanical property testing independently; and the workstation (17) controls simultaneously started testing of a plurality of specimens (9).

Abstract: A high-throughput and small size samples tension, compression, bending test system is disclosed. The system includes a computer unit, a motor and a number of the sample testing modules mounted horizontally or perpendicular to that ground on a workbench. The sample testing modules include a sample testing modules base plate fixedly attached to the workbench, and a ball screw, a displacement sensor, a moving beam, a clamp unit, a linear moving platform unit and a force value sensor arranged on the sample testing modules base plate. A number of the sample testing modules are arrange in parallel on the workbench or uniformly distributed in a circumferential direction with a point on the workbench as a circular center.

Abstract: An apparatus and method for a large-scale high-throughput quantitative characterization and three-dimensional reconstruction of a material structure. The apparatus having a glow discharge sputtering unit, a sample transfer device, a scanning electron microscope unit and a GPU computer workstation. The glow discharge sputtering unit can achieve large size (cm order), nearly flat and fast sample preparation, and controllable achieve layer-by-layer ablation preparation along the depth direction of the sample surface; rapid scanning electron microscopy (SEM) can achieve large-scale and high-throughput acquisition of sample characteristic maps. The sample transfer device is responsible for transferring the sample between the glow discharge sputtering source and the scanning electron microscope in an accurately positioning manner.