Abstract: Apparatus and method for spectroscopic analysis of scattering media. Subtle differences in materials have been found to be detectable from plots of intensity as a function of wavelength of collected emitted and scattered light versus wavelength of excitation light.
Type:
Grant
Filed:
February 12, 1992
Date of Patent:
April 12, 1994
Assignee:
The Regents of the University of California Los Alamos National Laboratory
Inventors:
Karlheinz Strobl, Irving J. Bigio, Thomas R. Loree