Patents Assigned to Thermal Wave Imaging, Inc.
  • Patent number: 11474059
    Abstract: A method for performing non-destructive testing using active thermography includes applying, using at least one thermal excitation device, a first excitation pulse to a workpiece; capturing, using an imaging device, a first iso-time frame of the workpiece; and determining a second excitation pulse by modifying one or more of a duration D of the first excitation pulse, an amplitude A of the first excitation pulse, or a spacing W between the first excitation pulse and the second excitation pulse. The method also includes applying, using the at least one of the thermal excitation device, the second excitation pulse to the workpiece; capturing, using the imaging device, a second iso-time frame of the workpiece; and determining a numerical fit of the first iso-time frame and the second iso-time frame.
    Type: Grant
    Filed: April 27, 2021
    Date of Patent: October 18, 2022
    Assignee: Thermal Wave Imaging, Inc.
    Inventors: Steven M. Shepard, Maria Frendberg Beemer
  • Publication number: 20210341403
    Abstract: A method for performing non-destructive testing using active thermography includes applying, using at least one thermal excitation device, a first excitation pulse to a workpiece; capturing, using an imaging device, a first iso-time frame of the workpiece; and determining a second excitation pulse by modifying one or more of a duration D of the first excitation pulse, an amplitude A of the first excitation pulse, or a spacing W between the first excitation pulse and the second excitation pulse. The method also includes applying, using the at least one of the thermal excitation device, the second excitation pulse to the workpiece; capturing, using the imaging device, a second iso-time frame of the workpiece; and determining a numerical fit of the first iso-time frame and the second iso-time frame.
    Type: Application
    Filed: April 27, 2021
    Publication date: November 4, 2021
    Applicant: Thermal Wave Imaging, Inc.
    Inventors: Steven M. Shepard, Maria Frendberg Beemer
  • Patent number: 9250134
    Abstract: An assembly including an optically excited infrared nondestructive testing active thermography system is disclosed. The optically excited infrared nondestructive testing active thermography system includes one or more illumination sources, at least one first reflector, at least one second reflector and a computing resource. The at least one first reflector is arranged about the one or more illumination sources. The at least one first reflector has a near focal point and a far focal point. The one or more illumination sources is/are positioned at least proximate the near focal point of the at least one first reflector. The at least one second reflector is positioned at least proximate the far focal point. The computing resource is communicatively-coupled to a motor that is coupled to the at least one second reflector for manipulating the at least one second reflector between at least: a first spatial orientation and a second spatial orientation.
    Type: Grant
    Filed: September 23, 2014
    Date of Patent: February 2, 2016
    Assignee: Thermal Wave Imaging, Inc.
    Inventors: Steven M. Shepard, Timothy Young, Maria Frendberg Beemer
  • Patent number: 9157878
    Abstract: A system for detecting aberrations within a workpiece having a conduit with an input end and an output end is disclosed. The system comprises a fluid delivery device arranged proximate to input end of conduit to pass fluid into input end of the conduit, the fluid delivery device having one or more fluid controllers that control one or more conditions of the fluid passed thereby, a sensor having an input and an output, the input arranged proximate to output end of conduit to measure one or more conditions of the fluid experienced by input, a workpiece exciter situated to excite workpiece and a processor having an input connected to the output of sensor, the processor having a correlator to correlate any changed of the one or more conditions of the fluid experienced by input of sensor with an excitement of workpiece by sensor.
    Type: Grant
    Filed: October 10, 2012
    Date of Patent: October 13, 2015
    Assignee: Thermal Wave Imaging, Inc.
    Inventor: Steven M. Shepard
  • Patent number: 8449176
    Abstract: A method for processing thermographic data is disclosed including thermally disturbing a specimen of unknown quality, collecting thermal data from said specimen, converting the collected data into a measure of variance and comparing the variance from the sample of unknown quality against the variance of a sample of known quality in order to determine if the quality of the specimen of unknown quality is acceptable.
    Type: Grant
    Filed: April 20, 2010
    Date of Patent: May 28, 2013
    Assignee: Thermal Wave Imaging, Inc.
    Inventor: Steven Shepard
  • Patent number: 8287183
    Abstract: A method of thermal inspection of a component defining at least one internal passageway. The method includes receiving a continuous sequence of thermal images of at least an exit hole defined by the at least one internal passageway at a surface of the component. The method also includes delivering a pressurized airflow pulse into the at least one internal passageway, receiving a temperature response signal as function of time based on the received thermal images, determining a first derivative of the temperature response signal, and determining a level of blockage of the at least one internal passageway based on the first derivative of the temperature response signal.
    Type: Grant
    Filed: March 17, 2011
    Date of Patent: October 16, 2012
    Assignee: Thermal Wave Imaging, Inc.
    Inventors: Steven Shepard, James R. Lhota, Tasdiq Ahmed, Bharat B. Chaudhry
  • Patent number: 7724925
    Abstract: A method for compiling thermographic data including obtaining data indicative of a monotonically changing characteristic of a specimen, sequencing the data or a surrogate of the data into a plurality of groups, categorizing, within each group, the frequency distribution of an attribute of the data or an attribute of said surrogate data, and compiling, from one or more groups, a collection of two or more of the frequency distributions.
    Type: Grant
    Filed: May 18, 2004
    Date of Patent: May 25, 2010
    Assignee: Thermal Wave Imaging, Inc.
    Inventor: Steven M. Shepard
  • Patent number: 7554086
    Abstract: A method for measuring the timing of a flash event including capturing a first image prior to the commencement of a flash event. Capturing a second image during the occurrence of the flash event, and comparing the second image to the first image to determine a time related characteristic of the flash event.
    Type: Grant
    Filed: October 7, 2005
    Date of Patent: June 30, 2009
    Assignee: Thermal Wave Imaging, Inc.
    Inventors: Steven Shepard, James R. Lhota
  • Patent number: 7186981
    Abstract: A pulse controller device for controlling the excitation of a heat source used in thermographic imaging is disclosed. The pulse controller device comprises a power supply, a heat source coupled to the power supply, a device coupled to the power supply signaling the power supply to deliver electrical power to the heat source, a sensor for sensing the delivery of electrical power to the heat source, a flash duration module coupled to said sensor for measuring a duration of time, and a gate device coupled to said flash duration module for gating the electrical power utilized by the heat source. A method for thermographically evaluating a sample is also disclosed.
    Type: Grant
    Filed: July 29, 2004
    Date of Patent: March 6, 2007
    Assignee: Thermal Wave Imaging, Inc.
    Inventors: Steven M. Shepard, Timothy Young
  • Patent number: 7083327
    Abstract: A active thermographic method for detecting subsurface defects in a specimen, particularly kissing unbond defects, includes heating a specimen, applying a force to the surface of the specimen to shift and separate the walls of the defect, and obtaining thermographic images of the specimen over time to monitor the heat flow through the specimen and detect thermal discontinuities. Because kissing unbond defects normally have good physical contact, and therefore good thermal conductivity, between its walls, these defects can go undetected in conventional active thermographic methods. By distorting the surface of the specimen, the kissing unbond defect is enlarged enough to generate sufficient thermal contrast for the defect to appear in the thermographic images.
    Type: Grant
    Filed: December 2, 1999
    Date of Patent: August 1, 2006
    Assignee: Thermal Wave Imaging, Inc.
    Inventor: Steven M. Shepard
  • Patent number: 6795784
    Abstract: A method an apparatus for non-destructive testing and evaluation of part samples includes obtaining a defect image of the sample, displaying the defect image on a display, referencing the defect image, such as through marking or annotation, to highlight locations at which defects or measurements are found, superimposing the defect image onto a live image of the part, and physically marking/annotating the part, tracing the marks from the defect image onto the physical sample, while viewing the live image. Because both the defect image and the live image are viewed through the same camera lens and are therefore subject to the same amount of distortion, the actual sample can be marked exactly according to the marks made in the defect image; there is no need to attempt matching a distorted defect image with the physical sample, as has been done in the prior art.
    Type: Grant
    Filed: January 12, 2001
    Date of Patent: September 21, 2004
    Assignee: Thermal Wave Imaging, Inc.
    Inventor: Steven M. Shepard
  • Patent number: 6751342
    Abstract: A method and system for non-destructive, reference-free thermographic detection of sub-surface defects uses an infrared camera to capture multiple, spatially different images of a sample that has been heated and allow to cool to equilibrium temperature. The temperature-time data obtained for each pixel in each image is converted into the logarithmic domain and a least squares fit is conducted on the data to generate a polynomial expression corresponding to the temperature-time data for a given pixel. This polynomial expression can be transformed into the original time domain to obtain temperature-time data with improved signal-to-noise characteristics.
    Type: Grant
    Filed: April 15, 2002
    Date of Patent: June 15, 2004
    Assignee: Thermal Wave Imaging, Inc.
    Inventor: Steven M. Shepard
  • Patent number: 6585146
    Abstract: A method and apparatus for automated, non-destructive evaluation of spot welds includes a device for heating a sample containing a spot weld, an infrared camera for detecting changes in the surface temperature of the weld, and a computer to acquire and analyze data from the camera. In one embodiment, the sample is heated on one side and the time-temperature characteristic is monitored as the heat travels through the sample and the spot weld. The computer generates a histogram that represents the relationship between a particular time-temperature characteristic and the number of pixels exhibiting that characteristic, thereby representing the quality and size of the weld nugget. By generating a histogram corresponding to weld quality, the inventive apparatus and method provides an objective weld quality indicator and allows automation of the evaluation process.
    Type: Grant
    Filed: January 5, 2001
    Date of Patent: July 1, 2003
    Assignee: Thermal Wave Imaging, Inc.
    Inventor: Steven M. Shepard
  • Patent number: 6516084
    Abstract: A method and system for non-destructive, reference-free thermographic detection of sub-surface defects uses an infrared camera to capture images of a sample that has been heated and allow to cool to equilibrium temperature. The temperature-time data obtained for each pixel in each image is converted into the logarithmic domain and a least squares fit is conducted on the data to generate a polynomial expression corresponding to the temperature-time data for a given pixel. This polynomial expression can be transformed into the original time domain to obtain temperature-time data with improved signal-to-noise characteristics. Defects can be detected by observing the zero-crossing characteristic of the second derivative of the polynomial.
    Type: Grant
    Filed: December 4, 2000
    Date of Patent: February 4, 2003
    Assignee: Thermal Wave Imaging, Inc.
    Inventor: Steven M. Shepard
  • Publication number: 20020134817
    Abstract: A method and apparatus for automated, non-destructive evaluation of spot welds includes a device for heating a sample containing a spot weld, an infrared camera for detecting changes in the surface temperature of the weld, and a computer to acquire and analyze data from the camera. In one embodiment, the sample is heated on one side and the time-temperature characteristic is monitored as the heat travels through the sample and the spot weld. The computer generates a histogram that represents the relationship between a particular time-temperature characteristic and the number of pixels exhibiting that characteristic, thereby representing the quality and size of the weld nugget. By generating a histogram corresponding to weld quality, the inventive apparatus and method provides an objective weld quality indicator and allows automation of the evaluation process.
    Type: Application
    Filed: January 5, 2001
    Publication date: September 26, 2002
    Applicant: Thermal Wave Imaging, Inc.
    Inventor: Steven M. Shepard
  • Patent number: 6065072
    Abstract: An imaging system which incorporates a gate (which can be implemented either in hardware or software) for gating video signals to a host PC. The present invention allows fixed frame cameras to be used in applications which would otherwise require the host PC to have prohibitively large amounts of random access memory. However, by selecting predetermined frames of video data from a fixed frame output camera, the present invention simulates the effect of a variable frame rate camera.
    Type: Grant
    Filed: May 29, 1997
    Date of Patent: May 16, 2000
    Assignee: Thermal Wave Imaging, Inc.
    Inventor: Laurence M. Flath
  • Patent number: 5683181
    Abstract: An embodiment of an apparatus for enhancing remote infrared (IR) temperature measurement of a low-emissivity sample includes a flexible membrane of a high-emissivity material for converting thermal energy from the sample into IR energy, an enclosed shroud, an IR camera, a light source, and at least one fan. The membrane is coupled to the enclosed shroud at one end of the shroud for supporting the membrane. The shroud includes at least four walls and an end wall opposite the membrane to define an interior space. The end wall includes an imaging window formed therethrough for accommodating the IR camera, which is provided for detecting IR energy radiated from the membrane. The light source is disposed in the interior space and mounted to the shroud for illuminating the membrane.
    Type: Grant
    Filed: May 12, 1995
    Date of Patent: November 4, 1997
    Assignee: Thermal Wave Imaging, Inc.
    Inventor: Steven M. Shepard