Abstract: Methods for linearization of photodetector response include establishing one or more static calibration coefficients based on comparison of test photodetector response to a linear reference photodetector. In some examples, dynamic calibration coefficients are determined based on average photodetector signals. In some applications such as FTIR, linearized ratios are obtained with a single calibration coefficient.

Abstract: Methods for linearization of photodetector response include establishing one or more static calibration coefficients based on comparison of test photodetector response to a linear reference photodetector. In some examples, dynamic calibration coefficients are determined based on average photodetector signals. In some applications such as FTIR, linearized ratios are obtained with a single calibration coefficient.

Abstract: Apparatus can include an input aperture configured to provide an input beam, primary optics configured to collimate the input beam, a grism situated to receive the collimated input beam and to produce a wavelength dispersed beam, and secondary optics configured to receive and direct the wavelength dispersed beam to a detector. Primary optics can include a primary reflector including an off-axis parabolic mirror, wherein the off-axis parabolic mirror is configured to produce the collimated input beam. Secondary optics can include a first secondary reflector and a second secondary reflector, wherein the first secondary reflector is situated to receive and reflect the wavelength dispersed beam to the second secondary reflector and the second secondary reflector is situated to receive and direct the wavelength dispersed beam to the detector.

Abstract: An embodiment of a microscope system is described that comprises a sample stage configured to position a sample; and a spectrometer comprising an interferometer configure to provide a light beam to the sample stage and one or more detectors configured to detect light spectra in response to the light beam, wherein the spectrometer sends a notification to the sample stage after a scan comprising an acceptable measure of quality has been acquired from the detected light spectra at a first location, and the sample stage is further configured to count the notifications and initiate movement of the sample stage to a second location when a count value reaches a pre-determined number.

Abstract: Aspects of the disclosure relate to utilizing independently stored validation keys to enable auditing of instrument measurement data maintained in a blockchain. A computing platform may receive, from a first block generator, a first data block comprising first measurement data captured by a first instrument and associated with a sample. Subsequently, the computing platform may receive a first validation key for the first data block calculated from contents of the first data block. Then, the computing platform may store the first data block and the first validation key for the first data block in a blockchain associated with the data management computing platform. Next, the computing platform may send the first validation key for the first data block to a data escrow database system, which may cause the data escrow database system to store the first validation key in a validation keys database.

Abstract: Disclosed herein are various systems and methods for optical emission spectroscopy. In some examples a substrate can be formed from conductive layers separated by a dielectric layer, the substrate having at least one recess therein, and the recess having a aperture therethrough. A chamber then encloses the area over the recess, the chamber including chamber walls, a gas inlet and a gas outlet to allow a gas to fill the chamber. An arc is then created across the substrate using the conductive layers. The arc may form a plasma using the gas inside the chamber. The plasma then ablates a surface of a specimen generating photons that can then be analyzed by a spectrometer.

Abstract: An optical measurement system measurement system for examining a sample. The measurement system comprises an internally reflective element, a stage, an optical assembly, a chassis, and a sensor. The internally reflective element has a contact surface. The stage is positioned below the internally reflective element. The stage and the internally reflective element are configured to apply a force to the sample. The optical assembly comprises a light source and a light detector. The optical assembly is configured to scan the sample by directing source light from the light source towards the contact surface and detecting source light optically interacting with the contact surface by the light detector. The chassis is configured to support the optical assembly and the internally reflective element. The sensor is mounted to the chassis and configured to detect the force applied to the sample by the internally reflective element and the stage.

Abstract: A measurement system configured to examine a sample. The system comprises an internally reflective element, a contact member, an actuator, an optical assembly, a sensor, and a controller. The contact member and the reflective element are configured to apply a force to the sample. The optical assembly is configured to scan the sample. Whereby prior to the scan, an initial force is applied to the sample, and after the scan, a resulting force is applied to the sample. The sensor is configured to detect the resulting force applied to the sample, and the controller is configured to receive a signal from the sensor indicative of the detected resulting force. The controller is further configured to control the actuator to adjust the force applied to the sample by the contact member and the internally reflective element from the resulting force to the initial force.

Abstract: An embodiment of a module system configured to interface with a microscope is described that comprises an input optical fiber configured to provide an excitation light beam from an external light source; dynamic alignment mirrors configured to adjust the position of the beams paths of the excitation light beam on a first plane; a coupling comprising a first end configured to engage with a complementary end, wherein the excitation light reflects off a turning mirror and travels along a beam path on a second plane through an orifice in the coupling; and an output optical fiber for delivering light from a sample to an external detector, wherein the light from the sample travels along the beam path on the second plane through the orifice in the coupling, reflects off the turning mirror and travels along one of the beam paths on the first plane to the output optical fiber.

Abstract: An embodiment of a support structure for adjusting the position of a plurality of optical elements is described that comprises a base plate comprising a centering pin, a first translation slot, and a second translation slot; and a translatable plate configured to operatively couple with a plurality of the optical elements and move relative to the base plate, wherein the translatable plate comprises a centering slot configured to engage with the centering pin, a first cam configured to engage with the first translation slot and control movement of the translatable plate along a first axis, and a second cam configured to engage with the second translation slot and control movement of the translatable plate along a second axis.

Abstract: Methods for linearization of photodetector response include establishing one or more static calibration coefficients based on comparison of test photodetector response to a linear reference photodetector. In some examples, dynamic calibration coefficients are determined based on average photodetector signals. In some applications such as FTIR, linearized ratios are obtained with a single calibration coefficient.

Abstract: An embodiment of a phase mask includes a light blocking layer disposed on a substrate, where the light blocking layer has a number of optically transmissive regions each configured as a first pattern. The first pattern includes two segments that have different phase configurations from each other, and the light blocking layer includes at least three angular orientations of the first pattern.

Abstract: Methods and apparatuses are disclosed whereby structured illumination microscopy (SIM) is applied to a scanning microscope, such as a confocal laser scanning microscope or sample scanning microscope, in order to improve spatial resolution. Particular aspects of the disclosure relate to the discovery of important advances in the ability to (i) increase light throughput to the sample, thereby increasing the signal/noise ratio and/or decreasing exposure time, as well as (ii) decrease the number of raw images to be processed, thereby decreasing image acquisition time. Both effects give rise to significant improvements in overall performance, to the benefit of users of scanning microscopy.

Abstract: An embodiment of a shutter assembly is described that comprises a support structure with a number of stations and operatively coupled to a motor configured to translate each of the stations to a position in front of a detector, wherein a first station comprises a first aperture, a first charged particle filter, and a first window; and a second station comprises a second aperture larger than the first aperture, a second charged particle filter, and a second window thinner than the first window.

Abstract: Aspects of the disclosure relate to utilizing independently stored validation keys to enable auditing of instrument measurement data maintained in a blockchain. A computing platform may receive, from a first block generator, a first data block comprising first measurement data captured by a first instrument and associated with a sample. Subsequently, the computing platform may receive a first validation key for the first data block calculated from contents of the first data block. Then, the computing platform may store the first data block and the first validation key for the first data block in a blockchain associated with the data management computing platform. Next, the computing platform may send the first validation key for the first data block to a data escrow database system, which may cause the data escrow database system to store the first validation key in a validation keys database.

Abstract: A laser mount assembly includes a lens holder including a collimating lens. A laser subassembly is positioned adjacent the lens holder and includes a vertical-cavity surface-emitting laser, a thermal electric cooler, and a thermistor. A printed circuit board is positioned adjacent the laser subassembly and includes a plurality of heating components. The heating components heat the area between the lens holder and the laser subassembly.

Abstract: A stray light reducing apparatus includes a light source and an entrance slit positioned to pass through light from the light source. A first monochromator mirror is positioned to reflect light passed through the entrance slit. A diffractive surface is positioned to receive and diffract light reflected by the first monochromator mirror. A second monochromator mirror is positioned to reflect light diffracted by the diffractive surface. An exit slit is positioned to pass through light reflected by the second monochromator mirror. A cuvette is positioned to pass through light passed through the exit slit. A long-pass interference filter is positioned to receive light from the light source, reflect light that has a wavelength below a selected value, and pass through light having a wavelength above the selected value. A first sample detector is positioned to receive light reflected by the long-pass interference filter.

Abstract: An embodiment of a method of automatically generating a background measurement in a spectrometer is described that comprises the steps of: collecting a plurality of candidate scans in the spectrometer; determining for each of the plurality of candidate scans if the candidate scan correlates to an orthonormal basis set that is associated with a recent background description; saving each candidate scan that correlates to the orthonormal basis set as a background scan in a scan cache; and generating a new background measurement from a plurality of the background scans stored in the scan cache if a current background measurement is older than a preselected time interval.

Abstract: An image analysis system includes a video camera that collects YUV color images of a liquid sample disposed between a capital and a pedestal, the color images being collected while a light source shines light through an optical beam path between the capital and the pedestal, and a processor adapted to i) obtain from the YUV color images a grayscale component image and a light scatter component image, and ii) obtain at least one binary image of the grayscale component image and at least one binary image of the light scatter component image.

Abstract: A mixing apparatus includes a well plate assembly including a fixed support, and a well movable with respect to the fixed support. A fixed sensor mount has a first portion disposed above the well and a second portion disposed within the well. A plurality of electromagnets are operable to move the well plate assembly vertically with respect to the fixed sensor mount and the fixed support.