Abstract: A cylindrical waveguide (1) for analyzing a flowing material (18) using guided microwave spectroscopy (GMS). Spaced apart plates (2, 5) each define a plane within the waveguide housing (3) that is parallel to the direction (47) of material flow through the waveguide. Two opposed frames (7, 19) each surround an aperture (6) that permits access to the region between the waveguide plates (2, 5). A microwave probe assembly (81) is mounted at each frame (7, 19) to permit the radiation and reception of electromagnetic waves within the housing (1). A temperature probe (51) is inserted into the interior of the housing (1) via fitting (13). A y-shaped assembly (89) can be used to divide the flow into two separate paths including a diverter vane (93) that permits flow to be equalized within the two separate flow paths.

Abstract: A metal detector used for identifying contaminants in packages on a conveyor. The detector includes coils a search head and an analog to digital converter generating a reactive signal and a resistive signal in response to the presence of a contaminant. During a learning mode a sample product passes through the metal detector providing a representative product effect signal which is stored by the reactive learn memory and the resistive learn memory. The learn memory values provide a reference value subtracted from each product signal during a normal production cycle, canceling the product effect caused by contaminants in individual packages. The product effect is monitored during successive cycles composed of a series of packages undergoing normal inspection by the metal detector. A tracking processor averages the product effect signal produced by the individual packages and continuously updates a product effect trend signal that is subtracted from each product signal.

Abstract: A contaminant detection machine (1) including a conveyor (3) which causes an object under inspection (79) to pass through a plane (48) of emitted x-ray radiation. The plane is generated by an x-ray tube (55) that emits a lateral beam, thereby permitting the distance (88) between the x-ray tube and the object under inspection to be reduced. A photo diode arch mounting assembly (104) is placed above the object under inspection and is mated to a collimator assembly (125) that also serves as the mounting bracket for the x-ray generation assembly (38), thereby preserving optical alignment between the photo diode detector array (28) and the emitted x-ray plane (48). The detector array (28) scans the object under inspection (79) so as to produce a continuous series of discrete lines, each line being analyzed by an image processing unit (116) to determine the presence or absence of a contaminant.