Abstract: An embodiment of a method for restoring detector resolution in an X-Ray fluorescence instrument is described that comprises: measuring a resolution value of a detector in the X-Ray fluorescence instrument using a standard material at a first temperature; determining that the measured resolution value deviates from a target value; and adjusting the temperature of the detector to a second temperature that restores the resolution value of the detector to the target value, wherein the temperature is adjusted by an amount defined by a relationship of temperature change to the degree of deviation of detector resolution from the target value.

Abstract: An apparatus includes at least one X-ray source that emits X-rays toward a sample, an X-ray fluorescence (XRF) detector that detects X-ray radiation scattered from the sample, an internal standard that emits scattered X-ray radiation in response to X-rays emitted from the at least one X-ray source, and a carriage assembly that translates the at least one X-ray source and XRF detector between a sample measurement position and an internal standard measurement position.

Abstract: A thermal control apparatus adapted for use with a pressurized air supply for controlling temperature of a component includes a vortex tube having an inlet adapted for connection with the pressurized air supply, a cold air outlet, and a hot air outlet, and a heat exchanger in fluid communication with the cold air outlet of the vortex tube, the heat exchanger being in thermal contact with the component and thereby controlling the temperature of the component. The heat exchanger further includes a post-heat-exchange exhaust air outlet in fluid communication with an exhaust air inlet adapted to direct the exhaust air along an outside of the vortex tube.