Patents Assigned to ThermoMicroscopes, Corp.
  • Patent number: 6265718
    Abstract: An optical system for a scanning probe microscope provides both an optical on-axis view and an optical oblique view of the sample by means of two optical paths each providing an image to a CCD camera via an auto-zoom lens. A shutter alternately blocks the image of either view from reaching the auto-zoom lens. The CCD camera provides the optical image to a video display which also displays the scanning probe image, thus eliminating the need for eyepieces and allowing easy viewing of both the optical and scanning probe images simultaneously.
    Type: Grant
    Filed: April 28, 2000
    Date of Patent: July 24, 2001
    Assignee: ThermoMicroscopes, Corp.
    Inventors: Sang-Il Park, Ian R. Smith
  • Patent number: 6057546
    Abstract: Scanning probe microscopes and scanning probe heads are provided having improved optical visualization and sample manipulation capabilities. The SPMs and SPM heads include at least one flexure stage for scanning in the x, y and/or z directions. In a preferred embodiment, the SPMs or SPM heads include flexure stages for scanning in the x, y and z directions. The z scanning stage is preferably positioned outside the lateral footprint of the x-y flexure stage so that a probe extending from the z scanning stage is outside the lateral footprint of the instrument. The SPMs and SPM heads are configured to provide top down and bottom up optical views of the sample and/or the probe and enable simultaneous scanning probe microscopy and optical imaging of a sample to be performed. The SPMs and SPM heads are designed to be readily combinable with existing upright and inverted optical microscopes currently available from various major manufacturers.
    Type: Grant
    Filed: August 4, 1998
    Date of Patent: May 2, 2000
    Assignee: ThermoMicroscopes Corp.
    Inventors: David Braunstein, Michael Kirk, Ouoc Ly, Thai Nguyen
  • Patent number: 6005251
    Abstract: A scanning mechanism is provided for use in a scanning probe microscope. The scanning mechanism includes a stationary portion; a moveable portion; a plurality of springs attaching the moveable portion to the fixed portion, the plurality of springs providing tension against movement of the moveable portion relative to the stationary portion, the tension provided by the plurality of springs having a substantially linear spring constant over a scan distance; and one or more voice coils attached to either the moveable portion or the stationary portion for moving the moveable portion relative to the stationary portion in one or more orthogonal directions.
    Type: Grant
    Filed: July 21, 1998
    Date of Patent: December 21, 1999
    Assignee: Thermomicroscopes Corp.
    Inventors: John D. Alexander, Marco Tortonese, Thai Nguyen