Patents Assigned to ThermoMicroscopes, Corp.
  • Scanning probe microscope with scan correction
    Patent number: 6265718
    Abstract: An optical system for a scanning probe microscope provides both an optical on-axis view and an optical oblique view of the sample by means of two optical paths each providing an image to a CCD camera via an auto-zoom lens. A shutter alternately blocks the image of either view from reaching the auto-zoom lens. The CCD camera provides the optical image to a video display which also displays the scanning probe image, thus eliminating the need for eyepieces and allowing easy viewing of both the optical and scanning probe images simultaneously.
    Type: Grant
    Filed: April 28, 2000
    Date of Patent: July 24, 2001
    Assignee: ThermoMicroscopes, Corp.
    Inventors: Sang-Il Park, Ian R. Smith