Patents Assigned to Thermo Niton Analyzer LLC
  • Patent number: 8515009
    Abstract: Techniques disclosed herein include systems and methods for identifying counterfeit gold jewelry and other counterfeit gold items. Techniques include determining—using a non-destructive mechanism—whether an item of interest (such as an article represented as true gold) is solid gold or a gold-plated object. Techniques include using an X-ray fluorescence (XRF) analyzer to differentiate true gold from gold plating. The XRF analyzer can distinguish between gold plating and bulk gold material by comparing a ratio of L-alpha and L-beta x-ray lines of gold. The analyzer measures a ratio of intensities of characteristic L-lines of gold using X-ray fluorescence (XRF) spectroscopy. When implemented using an XRF analyzer, the system nondestructively determines whether a test object is made of solid gold/gold alloy or has gold plating only.
    Type: Grant
    Filed: September 26, 2012
    Date of Patent: August 20, 2013
    Assignee: Thermo Niton Analyzers LLC
    Inventors: Stanislaw Piorek, Stephen I. Shefsky, Michael E. Dugas
  • Publication number: 20130202084
    Abstract: Techniques disclosed herein include systems and methods for identifying counterfeit gold jewelry and other counterfeit gold items. Techniques include determining—using a non-destructive mechanism—whether an item of interest (such as an article represented as true gold) is solid gold or a gold-plated object. Techniques include using an X-ray fluorescence (XRF) analyzer to differentiate true gold from gold plating. The XRF analyzer can distinguish between gold plating and bulk gold material by comparing a ratio of L-alpha and L-beta x-ray lines of gold. The analyzer measures a ratio of intensities of characteristic L-lines of gold using X-ray fluorescence (XRF) spectroscopy. When implemented using an XRF analyzer, the system nondestructively determines whether a test object is made of solid gold/gold alloy or has gold plating only.
    Type: Application
    Filed: September 26, 2012
    Publication date: August 8, 2013
    Applicant: THERMO NITON ANALYZERS LLC
    Inventor: THERMO NITON ANALYZERS LLC
  • Patent number: 8184287
    Abstract: An optical emission spectroscopic system contains multiple distinct light paths that provide increased light to a spectrometer, thereby increasing sensitivity and signal-to-noise of the system.
    Type: Grant
    Filed: August 25, 2009
    Date of Patent: May 22, 2012
    Assignee: Thermo Niton Analyzers LLC
    Inventors: Mark A. Hamilton, John E. Goulter
  • Patent number: 8155268
    Abstract: A method is provided for screening lead concentration compliance of objects, particularly consumer products such as toys, using x-ray fluorescence (XRF) analysis. The measured intensity ratio of the characteristic L? and L? x-rays of lead provides an indication of whether the lead is located primarily in a coating (e.g., paint) layer on the object, or in a thin or thick bulk material. If the intensity ratio indicates that the lead is located in a coating layer or distributed in a thin bulk material, an areal density of lead is determined from at least one of the characteristic x-ray intensities, and the measured areal density is compared to specified lower and upper limits to determine whether the object is unambiguously compliant, unambiguously non-compliant, or indeterminate.
    Type: Grant
    Filed: April 23, 2010
    Date of Patent: April 10, 2012
    Assignee: Thermo Niton Analyzers LLC
    Inventors: John Pesce, Lee Grodzins
  • Patent number: 8022349
    Abstract: Time-resolved analysis of a spectrum is performed by illuminating a one-dimensional array of charge-transfer device light-sensitive pixel cells and periodically non-destructively copying charges in the light-sensitive cells to respective storage cells (“row storage registers”) co-located with the light-sensitive cells in an integrated circuit. Information about the charges stored in at least some of the storage cells is provided to a component external to the integrated circuit.
    Type: Grant
    Filed: February 22, 2008
    Date of Patent: September 20, 2011
    Assignee: Thermo Niton Analyzers LLC
    Inventors: Denis Baiko, Suraj Bhaskaran, Judd Jenne, Mark Hamilton, George Lungu, Bruce Pirger, John Swab, Steven VanGorden, Herbert Ziegler, Michael Pilon
  • Patent number: 7933379
    Abstract: A method, instrument, and computer program software product for characterizing a sample with respect to the presence of a specified element, either as a constituent of a surface layer or of the bulk of the sample. Intensities of fluorescent emission at two characteristic emission lines are compared to establish whether the specified element is disposed above the bulk of the sample. In the case where the specified element is disposed above the bulk of the sample, an areal density of the specified element is determined, whereas in the case where the specified element is disposed within the bulk of the sample, a volumetric concentration of the specified element within the sample is determined.
    Type: Grant
    Filed: March 17, 2010
    Date of Patent: April 26, 2011
    Assignee: Thermo Niton Analyzers LLC
    Inventors: Lee Grodzins, John Pesce
  • Patent number: 7916834
    Abstract: A hand-held, self-contained x-ray fluorescence (XRF) analyzer produces a small x-ray spot on a sample to interrogate the elemental composition of a sample region of millimeter-size characteristic dimension. The analyzer includes a collimator for aiming an x-ray beam toward a desired location on the sample and for determining the size of the spot produced on the sample. The analyzer may include a digital camera oriented toward the portion of the sample that is, or would be, interrogated by the x-ray spot to facilitate aiming the analyzer. The analyzer may generate a reticule in a displayed image to indicate the portion of the sample that is, or would be, illuminated by the x-ray beam. The analyzer may automatically annotate the image of the sample with text or graphics that contain information about the analyzed sample. The image may be stored in the hand -held analyzer or provided for external storage or display.
    Type: Grant
    Filed: February 11, 2008
    Date of Patent: March 29, 2011
    Assignee: Thermo Niton Analyzers LLC
    Inventors: Stanislaw Piorek, Mark Hamilton, Kenneth P. Martin, Pratheev Sreetharan, Michael E. Dugas, Paul Estabrooks, Lee Grodzins
  • Patent number: 7899153
    Abstract: A method for classifying a sample based upon a complete spectral analysis. The sample is illuminated with penetrating radiation and an initial complete spectral analysis is performed based on spectral resolution of resonant fluorescence lines emitted at the surface, or within the volume, of the sample. If the initial complete spectral analysis yields the composition of the sample to within acceptable limits, analysis values are output to the user. Otherwise, further analysis, informed by the results if the initial complete spectral analysis, is performed.
    Type: Grant
    Filed: April 17, 2009
    Date of Patent: March 1, 2011
    Assignee: Thermo Niton Analyzers LLC
    Inventors: Michael E. Dugas, Lee Grodzins, Stephen I. Shefsky
  • Patent number: 7875847
    Abstract: An analytical instrument may be docked in a stand. The stand provides electrical power, cooling, gas to purge air from an analytical gap within the instrument and/or other supplies or services to the instrument. The stand contains a contactless memory, such as an RF-ID tag, which stores information about the supplies and/or services the stand is capable of providing to the instrument. The instrument reads the stand's contactless memory and automatically sets operational parameters of the instrument in accordance with the supplies and/or services the stand is capable of providing. Thus, the instrument may automatically operate in an enhanced mode, such as at a higher x-ray beam power, as a result of being mounted in the stand.
    Type: Grant
    Filed: August 28, 2008
    Date of Patent: January 25, 2011
    Assignee: Thermo Niton Analyzers LLC
    Inventors: Michael E. Dugas, Mark Hamilton, Kenneth P. Martin
  • Patent number: 7821634
    Abstract: Multiple energy sources, such as a laser and electrical current, are employed, in close coordination, spatially and temporally, to clean a sample, vaporize its material and excite vapor atoms for the purpose of atomic emission spectroscopy. These methods permit better monitoring and control of the individual processes in real time, lead to higher consistency and higher quality optical emission spectra, and enhance the measurements of non-conducting solids, liquids and gases. Additionally, a portable instrument is provided with both laser source and spectrometer optically coupled to a hand-holdable unit.
    Type: Grant
    Filed: April 18, 2008
    Date of Patent: October 26, 2010
    Assignee: Thermo Niton Analyzers LLC
    Inventors: Robert Dillon, Lee Grodzins, Stephanie Melikian
  • Patent number: 7787589
    Abstract: Methods for in vivo measurement of lead or other trace elements in bone by x-ray fluorescence (XRF) without independent measurement of underlying tissue thickness are disclosed. In one method, the lead concentration is calculated based on the intensity of a first characteristic fluoresced peak and a function having as an argument the intensity ratio of first and second characteristic fluoresced peaks, with at least one parameter of the function being empirically determined by measurements of calibration phantoms having differing thicknesses of tissue surrogate material. In another method, the lead concentration is measured by estimating tissue thickness based on the intensity of the Compton scattering peak, or ratio of Compton/Rayleigh intensities, and the intensity of a characteristic fluoresced x-ray peak corrected for attenuation by tissue of the estimated thickness. Also disclosed is a method for determining the calcium concentration and density of bone based on XRF spectrum data.
    Type: Grant
    Filed: April 30, 2009
    Date of Patent: August 31, 2010
    Assignee: Thermo Niton Analyzers LLC
    Inventor: Lee Grodzins
  • Patent number: 7702067
    Abstract: A method, instrument, and computer program software product for characterizing a sample with respect to the presence of a specified element, either as a constituent of a surface layer or of the bulk of the sample. Intensities of fluorescent emission at two characteristic emission lines are compared to establish whether the specified element is disposed above the bulk of the sample. In the case where the specified element is disposed above the bulk of the sample, an areal density of the specified element is determined, whereas in the case where the specified element is disposed within the bulk of the sample, a volumetric concentration of the specified element within the sample is determined.
    Type: Grant
    Filed: September 5, 2008
    Date of Patent: April 20, 2010
    Assignee: Thermo Niton Analyzers LLC
    Inventors: Lee Grodzins, John Pesce
  • Patent number: 7671350
    Abstract: An instrument and method for measuring the elemental composition of a test material. The instrument has a source of penetrating radiation for irradiating an irradiated region of the test material, a detector for detecting fluorescence emission by the test material and for generating a detector signal, and a controller for converting the detector signal into a spectrum characterizing the composition of the test material. A platen of attenuating material extends outward from adjacent to, and surrounding, the irradiated surface of the test material. In certain embodiments, the thickness of the attenuating platen is tapered such as to decrease with increasing radial distance from the central irradiated region of the test material.
    Type: Grant
    Filed: May 25, 2007
    Date of Patent: March 2, 2010
    Assignee: Thermo Niton Analyzer LLC
    Inventor: Lee Grodzins
  • Patent number: 7657003
    Abstract: An x-ray source produces a well-defined electron beam, without an undesirable halo. The x-ray source includes a housing, a cathode disposed within the housing, an anode spaced apart from the cathode for accelerating electrons emitted from the cathode and an x-ray emitter target disposed within the housing and spaced apart from the cathode for impact by the accelerated electrons. The cathode includes a passivation layer over only a portion of the area of the cathode, leaving an emission portion of the cathode that is not passivated. The passivation layer reduces or prevents emissions from the passivated portion of the cathode, thereby preventing a halo, which would otherwise be produced by lower-level emissions from the portion of the cathode that surrounds the emission portion of the cathode.
    Type: Grant
    Filed: September 4, 2008
    Date of Patent: February 2, 2010
    Assignee: Thermo Niton Analyzers LLC
    Inventor: William L. Adams
  • Patent number: 7634052
    Abstract: A method for obtaining a concentrated, monochromatic x-ray beam from a standard x-ray tube or other source of polychromatic emission. X-rays from the anode of the x-ray tube fluoresce an adjoining, independent target that produces a monochromatic spectrum, a portion of which is focused by the x-ray optical system. This two-stage method gives the system considerably versatility without undue loss in signal. The two-stage concentrator makes practical the use of focusing optics in hand-held and portable instruments.
    Type: Grant
    Filed: March 5, 2007
    Date of Patent: December 15, 2009
    Assignee: Thermo Niton Analyzers LLC
    Inventors: Lee Grodzins, Hal Grodzins
  • Patent number: 7623614
    Abstract: An apparatus for inspecting objects utilizes a fan beam or flood beam to illuminate the inspected region of the object. A modulator, which may take the form of a movable mask, dynamically encodes the beam so that each segment of the inspected region receives varying amounts of radiation according to a predetermined temporal sequence. The resultant signal produced by a backscatter detector or optional transmission detector receiving radiation from the object is decoded to recover spatial information so that an image of the inspected region may be constructed.
    Type: Grant
    Filed: October 24, 2007
    Date of Patent: November 24, 2009
    Assignee: Thermo Niton Analyzers LLC
    Inventor: Stephen I. Shefsky
  • Patent number: 7525101
    Abstract: An apparatus for selective radiation detection includes a neutron detector that facilitates detection of neutron emitters, e.g. plutonium, and the like; a gamma ray detector that facilitates detection of gamma ray sources, e.g., uranium, and the like. The apparatus comprises a first light guide, optically coupled to a first optical detector; a second light guide, optically coupled to a second optical detector a sheet of neutron scintillator, opaque for incoming optical photons, said sheet of neutron scintillator sandwiched between the first and the second light guides. The second light guide comprises a gamma ray scintillator material.
    Type: Grant
    Filed: May 26, 2006
    Date of Patent: April 28, 2009
    Assignee: Thermo Niton Analyzers LLC
    Inventor: Lee Grodzins
  • Publication number: 20090079980
    Abstract: A spectrometer includes a structural member made of a light-weight material having a small coefficient of thermal expansion (CTE). The spectrometer is dimensionally stable over a range of expected ambient temperatures, without controlling the temperature of the spectrometer.
    Type: Application
    Filed: February 22, 2008
    Publication date: March 26, 2009
    Applicant: THERMO NITON ANALYZERS LLC
    Inventors: John E. Goulter, Mark Hamilton, Pratheev Sreetharan
  • Publication number: 20090050786
    Abstract: Time-resolved analysis of a spectrum is performed by illuminating a one-dimensional array of charge-transfer device light-sensitive pixel cells and periodically non-destructively copying charges in the light-sensitive cells to respective storage cells (“row storage registers”) co-located with the light-sensitive cells in an integrated circuit. Information about the charges stored in at least some of the storage cells is provided to a component external to the integrated circuit.
    Type: Application
    Filed: February 22, 2008
    Publication date: February 26, 2009
    Applicant: THERMO NITON ANALYZERS LLC
    Inventors: Denis Baiko, Suraj Bhaskaran, Judd Jenne, Mark Hamilton, George Lungu, Bruce Pirger, John Swab, Steven VanGorden, Herbert Ziegler, Michael Pilon
  • Publication number: 20080212074
    Abstract: A hand-held, self-contained, battery-powered test instrument for analyzing composition of a sample includes an exciter for exciting at least a portion of the sample, a compact cross-dispersed spectrometer for receiving an optical signal from the excited portion of the sample and a processor for processing spectral data about the optical signal from the spectrometer. The exciter may include a spark generator and a counter electrode, a laser or other device for generating the optical signal from the sample portion. The spectrometer has a wavelength range broad enough to enable the test instrument to detect and determine relative quantities of carbon, phosphorous, sulfur, manganese, silicon, iron and other elements necessary to identify common alloys. The spectrometer includes a structural member made of a light-weight material having a small coefficient of thermal expansion (CTE).
    Type: Application
    Filed: February 22, 2008
    Publication date: September 4, 2008
    Applicant: THERMO NITON ANALYZERS LLC
    Inventors: John E. Goulter, Mark Hamilton, Pratheev Sreetharan