Abstract: A processing application receives peak information associated with multiple known references samples. The processing application partitions a spectrum into multiple different sized range bins such that a substantially equal number of the peaks associated with the known reference samples reside into each of the multiple different sized range bins. To identify a set of candidate reference samples in a library of reference samples that potentially are a good match an unknown sample under test, the processing application compares peaks associated with the unknown sample to the multiple different sized range bins. The greater the number of range bin matches based on peaks in the unknown sample and peaks in a corresponding reference sample, the greater the likelihood that the unknown sample matches the corresponding reference sample.

Abstract: An optical emission spectroscopic (OES) instrument includes a spectrometer, a processor and an adjustable mask controlled by the processor. The adjustable mask defines a portion of an analytical gap imaged by the spectrometer. The instrument automatically adjusts the size and position of an opening in the mask, so the spectrometer images an optimal portion of plasma formed in the analytical gap, thereby improving signal and noise characteristics of the instrument, without requiring tedious and time-consuming manual adjustment of the mask during manufacture or use.

Abstract: A method of detecting an explosive material, and an analyzer and computer program products that may perform such methods. A method may include illuminating at least a portion of the material with light, and monitoring the temperature of the illuminated portion. T power or location of the illuminating light may be altered in response to the monitored temperature. Raman spectral data are produced in response to Raman radiation emitted from the portion in response to the light. The composition of the material may be analyzed based on the Raman spectral data or generating an indication to an operator that the material cannot be safely analyzed.

Abstract: In an embodiment, an apparatus may include a light source, a beam manipulator, an optical component, an analyzer, and a detector. The light source may generate an incident light at a first frequency. The beam manipulator may include one or more polyhedron-shaped prisms that may deflect the incident light for focus at a plurality of points on a sample. The optical component may collect the deflected incident light, focus the collected deflected incident light at the plurality of points on the sample, and collect scattered light from the sample. The scattered light may include elastic scattered light and/or inelastic scattered light. The inelastic scattered light may have a second frequency that is shifted up or down from the first frequency. The detector may detect the inelastic scattered light and the analyzer may identify a substance contained in the sample based on the detected inelastic scattered light.

Abstract: A device for producing x-rays includes: a housing that includes a folded high-voltage multiplier coupled to a filament transformer, the transformer coupled to an x-ray tube for producing the x-rays. A method of fabrication and an x-ray source are disclosed.

Abstract: A method of identifying the presence of heroin in an impure heroin composition which contains heroin and at least one fluorescent contaminant which interferes with a Raman signal from the heroin. The method may include contacting the mixture with a solvent such as an alcohol, then contacting the resulting alcohol composition with a SERS surface. The surface may then be exposed to laser light from a hand-held Raman spectrometer to detect a Raman signal from the heroin. An apparatus for performing the method is also provided.

Abstract: A Raman spectrometer including a laser excitation source, edge filters, and detection optics that direct light into a spectrograph. A spectrograph containing a dispersive element and optics that directs various wavelengths of light onto a segmented diffractive MEMS light modulator array. The MEMS array, depending on actuation state, directs light either to or away from a single detector. Control electronics drive the MEMS light modulator for either sequential wavelength measurement or multiplexed wavelength measurement (Hadamard for example).

Abstract: Featured is a method for reducing frequency of taking background spectra in FTIR or FTIR-ATR spectroscopy. Such a method includes determining if there is a pre-existing reference spectrum available and if such a reference spectrum is available, acquiring a present reference scan before acquiring a sample scan. The method also includes comparing the present reference scan with the pre-existing reference spectrum to determine if there is one or more non-conformities therebetween and if there is/are one or more nonconformities, determining if the one or more non-conformities are resolvable or not. If the one or more non-conformities are resolvable; resolve each non-conformity in a determined manner and thereafter acquiring a scan of the sample, and if the non-conformities are not resolvable, then acquiring a new reference sample and thereafter acquiring a scan of the sample.

Abstract: A method, apparatus and computer program product for tagging reference materials of interest in spectroscopic searching applications is presented. A reference list of materials to be considered as part of a final analysis of a spectroscopic analysis of a sample material is generated. A watchlist of at least one material to be retained for a final analysis of the spectroscopic analysis of a sample material is provided. A final analysis of the sample material is preformed using the watchlist of at least one material and the reference list of materials. A determination is then made regarding whether a spectrum of the sample material matches at least one spectrum of materials on the watchlist and on the reference list.

Abstract: A method of detecting an explosive material, and an analyzer and computer program products that may perform such methods. A method may include illuminating at least a portion of the material with light, and monitoring the temperature of the illuminated portion. T power or location of the illuminating light may be altered in response to the monitored temperature. Raman spectral data are produced in response to Raman radiation emitted from the portion in response to the light. The composition of the material may be analyzed based on the Raman spectral data or generating an indication to an operator that the material cannot be safely analyzed.

Abstract: A sample cell for a spectrometer, and a spectrometer using such a sample cell. The sample cell may include a housing having a reflective inner surface which is at least a section of a spheroid bounding a cavity. A lens system receives electromagnetic radiation from a source and directs a converging beam through a port in the cavity to a focal point inside the cavity, such that the beam undergoes multiple reflections on the inner surface before exiting the cavity. Arrangements for adjusting beam cross-sectional area and angle are optionally provided. Methods which can be performed on such an apparatus and computer program products for performing such methods are further provided.

Abstract: A Raman spectrometer including a laser excitation source, edge filters, and detection optics that direct light into a spectrograph. A spectrograph containing a dispersive element and optics that directs various wavelengths of light onto a segmented diffractive MEMS light modulator array. The MEMS array, depending on actuation state, directs light either to or away from a single detector. Control electronics drive the MEMS light modulator for either sequential wavelength measurement or multiplexed wavelength measurement (Hadamard for example).

Abstract: An analyzer for analyzing a composition of a sample, and methods of operating an analyzer. The analyzer may include an optical illuminator and a Raman spectrometer to produce Raman spectral data representative of Raman radiation emitted from the sample in response to the illuminating light. Features to reduce background fluorescence are optionally provided. An x-ray illuminator may be provided to illuminate the sample with x-rays, and also an x-ray spectrometer may be present to produce x-ray spectral data representative of fluorescence radiation emitted from the sample in response to the illuminating x-rays. A processor receives the Raman spectral data and any x-ray spectral data and provides an analysis of a compound in the sample.

Abstract: An x-ray beam control system includes a feedback control loop circuit having a modulation circuit. The feedback control loop circuit generates a control signal. A x-ray tube, has a filament response profile of tube current versus filament temperature that is non-linear. A compensation circuit receives the control signal and modifies the control signal according to a compensating function that is matched to the filament response profile. The modulation circuit receives the modified control signal and generates a drive signal. The x-ray tube receives the drive signal at a filament thereof, and outputs a tube current signal having a linear response to the control signal. The feedback control loop circuit receives the tube current signal.

Abstract: A spectrometer includes: a collimating element configured for collimating a beam of light into a first one of a cross-dispersing element and an echelle grating, the grating in optical communication with the cross-dispersing element; a focusing element for receiving the light from a second one of the cross-dispersing element and the echelle grating and focusing wavelengths of the light onto a spatial light modulator; the spatial light modulator configured for selectively directing the wavelengths onto a detector for detection. A method of use and the method of fabrication are provided.

Abstract: In an embodiment, an apparatus includes a module assembly and a main assembly. The module assembly includes a module assembly housing, a first faceplate and an analysis unit attached to the first faceplate. The main assembly includes a main assembly housing, a second faceplate and an engine unit rigidly attached to the second faceplate. The engine unit generates a light that passes to the analysis unit via a first lens assembly and a second lens assembly. The first lens assembly is attached to the first faceplate and the second lens assembly is attached to the second faceplate. The module assembly when attached to the main assembly causes the first and second faceplates to act as a single mechanical unit that moves independent of movement of the module assembly housing and/or the main assembly housing.

Abstract: Disclosed are apparatus, kits, methods, and systems that include a radiation source configured to direct radiation to a sample; a detector configured to measure radiation from the sample; an electronic processor configured to determine information about the sample based on the measured radiation; a housing enclosing the source, the detector, and the electronic processor, the housing having a hand-held form factor; an arm configured to maintain a separation between the sample and the housing, the arm including a first end configured to connect to the housing and a second end configured to contact the sample; and a layer positioned on the second end of the arm, the layer being configured to contact the sample and to transmit at least a portion of the radiation from the sample to the detector.