Patents Assigned to Tiama
  • Patent number: 8288700
    Abstract: An installation for marking, at the exit of a forming machine (3), transparent or translucent objects running horizontally, in succession, in front of a marking station (7) comprises a device (9) for producing a laser beam to ensure marking of the objects. The installation includes a camera for determining the position of each of the objects along at least one direction transverse to the running direction (D) of the objects, the camera upstream of the marking station relative to the running direction. The focusing plane of the laser beam is displaced along a transverse direction relative to the running direction (D) with a guide driving the displacement means and connected to the camera to make it possible to adjust the focusing plane of the laser beam in order to optimize the marking of the objects by the laser beam.
    Type: Grant
    Filed: October 18, 2007
    Date of Patent: October 16, 2012
    Assignee: Tiama
    Inventor: Guillaume Bathelet
  • Patent number: 8164746
    Abstract: The invention relates to an illumination device for a control station for determining the presence of defects on the image of the surface(s) of the collar of a transparent or translucent container. The inventive device comprises at least one illumination system quasi-constantly illuminating each point of a surface encompassing the collar surface(s) according to the totality or parts of incidences included in at least one part of a 2?-steradian solid angle and means for blocking at least one part of light beams which illuminate outside of the surface(s) of the collar and can bring about stray reflections in the collar image.
    Type: Grant
    Filed: November 9, 2005
    Date of Patent: April 24, 2012
    Assignee: Tiama
    Inventor: Olivier Colle
  • Publication number: 20110108627
    Abstract: The invention relates to a method of using a light source (5) possessing a lighting surface (S) and a camera (6) presenting an observation optical axis (A) to analyze a mark (2) made on the outside surface (31) of a curved wall (3) made of a material that is translucent or transparent, the method being characterized by: making the light source extensive and uniform in such a manner that: firstly the extent of the virtual image (S?) of the lighting surface (S) of the light source (5) completely covers the surface of the mark (2); and the brightness of the virtual image (S?) of the lighting surface (S) of the light source (5) is uniform; and observing the surface of the mark (2) superposed on the surface of the virtual image (S?) so as to enable the mark (2) to be analyzed.
    Type: Application
    Filed: July 7, 2009
    Publication date: May 12, 2011
    Applicant: TIAMA
    Inventors: Guillaume Bathelet, Marc Leconte
  • Patent number: 7583377
    Abstract: An optoelectronic process for inspection of an area of revolution of a receptacle presenting an axis of revolution, includes: illumination of the surface to be inspected using a lighting system presenting an axis of revolution that is located in the extension of the axis of revolution of the receptacle, formation of an image of the inspected surface using a camera, and analysis of the image formed with a view to checking the characteristics of the surface to be inspected. The illumination is over at least three angular sectors, each emitting a given radiation spectrum that is separate from all the spectra of the other sectors. Only the light rays returned by the surface to be inspected are selected and one of the said given radiation spectra are presented to eliminate the parasitic light rays whose radiation spectrum does not correspond to that selected for the said angular sector.
    Type: Grant
    Filed: October 13, 2004
    Date of Patent: September 1, 2009
    Assignee: Tiama
    Inventor: Olivier Colle
  • Patent number: 7417725
    Abstract: In an optical method for determining surface defects and/or material shortage on the neck ring (3) of a container having an axis of symmetry (X) comprises illuminating the surface(s) of the neck ring (3) of the container with an incident light beam, a uniform ring of light (C) is obtained that converges towards a point of convergence located on the axis of symmetry (X) of the container with a variable diameter (D) and/or variable width (E). The diameter (D) of the convergent ring of light (C) at a given value in relation to a desired mean angle of incidence (?) to illuminate the surface of the neck ring (3) of the container and/or the width (E) of the convergent uniform ring of light (C) at a given value in relation to the width (L) of surface of the neck ring (3) of the container are selected.
    Type: Grant
    Filed: October 24, 2003
    Date of Patent: August 26, 2008
    Assignee: TIAMA
    Inventors: Olivier Colle, Marc Leconte
  • Patent number: 7317524
    Abstract: A device for detecting surface defects (2) on the neck ring (3) of a container comprises: a light source (5) illuminating, by means of an incident light beam, a section of the surface of the neck ring of the container, along a determined incident direction (Di), at least one linear sensor (10) measuring light beams, arranged to receive the light beam reflected by the surface defect, the angle (?) between the incident (Di) and reflection (Dr) directions lying between 15 and 45°, preferably in the order of 30°, one of the directions being parallel to the axis of revolution of the container, means (15) for ensuring the rotation of the container about the axis of revolution through at least one rotation, and a unit (16) for analysing and processing light beams received by the linear sensor, to identify the presence of a surface defect.
    Type: Grant
    Filed: October 24, 2003
    Date of Patent: January 8, 2008
    Assignee: Tiama
    Inventors: Marc Gerard, Guillaume Bathelet
  • Patent number: 7230229
    Abstract: The device for detecting surface defects on the outer wall (2) of a transparent or translucent object (3), comprises: a broad light source (4), adapted to send a light beam (5) onto a surface of the wall (2), a linear sensor (8) for measuring light beams, arranged to collect the light beam (9) reflected by a linear zone of the wall (2), illuminated by the light source (4), means (12) ensuring relative movement between the object and the light source (4) and the linear measuring sensor (8), to move the linear measuring zone over the wall (2) of the object to cover the surface to be inspected, and a unit (15) for analysing and processing the light beams, received by the measuring sensor (8), for creating an image and to identify within the image the presence of a surface defect corresponding to a dark area.
    Type: Grant
    Filed: October 24, 2003
    Date of Patent: June 12, 2007
    Assignee: Tiama
    Inventors: Marc Gerard, Guillaume Bathelet
  • Patent number: 7098440
    Abstract: The invention provides a method of using at least one sensor sensitive to infrared radiation for inspecting hollow, transparent or translucent articles at high temperature leaving various different forming cavities. The method includes a step of evaluating the level of infrared radiation from the articles coming from the forming cavities so as to adapt the exposure of the sensor in a subsequent step of inspecting the articles in such a manner as to cause the response of the sensor to be uniform regardless of the different cavities from which the articles come.
    Type: Grant
    Filed: April 29, 2004
    Date of Patent: August 29, 2006
    Assignee: Tiama
    Inventors: Guillaume Bathelet, Marc Gerard